{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,17]],"date-time":"2025-12-17T18:09:43Z","timestamp":1765994983334},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,3,14]],"date-time":"2022-03-14T00:00:00Z","timestamp":1647216000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,3,14]],"date-time":"2022-03-14T00:00:00Z","timestamp":1647216000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,3,14]]},"DOI":"10.23919\/date54114.2022.9774549","type":"proceedings-article","created":{"date-parts":[[2022,5,19]],"date-time":"2022-05-19T20:35:05Z","timestamp":1652992505000},"page":"88-91","source":"Crossref","is-referenced-by-count":9,"title":["HyperX: A Hybrid RRAM-SRAM partitioned system for error recovery in memristive Xbars"],"prefix":"10.23919","author":[{"given":"Adarsh","family":"Kosta","sequence":"first","affiliation":[{"name":"Purdue University,West Lafayette,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Efstathia","family":"Soufleri","sequence":"additional","affiliation":[{"name":"Purdue University,West Lafayette,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Indranil","family":"Chakraborty","sequence":"additional","affiliation":[{"name":"Purdue University,West Lafayette,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Amogh","family":"Agrawal","sequence":"additional","affiliation":[{"name":"Purdue University,West Lafayette,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Aayush","family":"Ankit","sequence":"additional","affiliation":[{"name":"Purdue University,West Lafayette,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kaushik","family":"Roy","sequence":"additional","affiliation":[{"name":"Purdue University,West Lafayette,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/27\/36\/365202"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.23919\/DATE48585.2020.9116244"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISLPED.2019.8824820"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.23919\/DATE51398.2021.9474179"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8715066"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2019.2944782"},{"key":"ref16","doi-asserted-by":"crossref","DOI":"10.1145\/3240765.3240805","article-title":"Emat: An efficient multi-task architecture for transfer learning using reram","author":"chen","year":"2018","journal-title":"ICCAD"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/DAC18072.2020.9218605"},{"key":"ref18","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-030-01424-7_27","article-title":"A Survey on Deep Transfer Learning","author":"tan","year":"2018","journal-title":"Lecture Notes in Computer Science"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3297858.3304049"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2190369"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3007787.3001139"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2020.3003007"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TETCI.2018.2829919"},{"journal-title":"Geniex A generalized approach to emulating nonideality in memristive xbars using neural networks","year":"2020","author":"chakraborty","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-018-0059-3"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3362035"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/3079856.3080246"}],"event":{"name":"2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2022,3,14]]},"location":"Antwerp, Belgium","end":{"date-parts":[[2022,3,23]]}},"container-title":["2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9774496\/9774497\/09774549.pdf?arnumber=9774549","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,2,5]],"date-time":"2023-02-05T17:55:51Z","timestamp":1675619751000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9774549\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,3,14]]},"references-count":19,"URL":"https:\/\/doi.org\/10.23919\/date54114.2022.9774549","relation":{},"subject":[],"published":{"date-parts":[[2022,3,14]]}}}