{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,18]],"date-time":"2026-05-18T03:23:28Z","timestamp":1779074608930,"version":"3.51.4"},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,3,14]],"date-time":"2022-03-14T00:00:00Z","timestamp":1647216000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,3,14]],"date-time":"2022-03-14T00:00:00Z","timestamp":1647216000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,3,14]]},"DOI":"10.23919\/date54114.2022.9774672","type":"proceedings-article","created":{"date-parts":[[2022,5,19]],"date-time":"2022-05-19T16:35:05Z","timestamp":1652978105000},"page":"1419-1424","source":"Crossref","is-referenced-by-count":12,"title":["BMC+Fuzz: Efficient and Effective Test Generation"],"prefix":"10.23919","author":[{"given":"Ravindra","family":"Metta","sequence":"first","affiliation":[{"name":"TCS Research,Pune,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Raveendra Kumar","family":"Medicherla","sequence":"additional","affiliation":[{"name":"TCS Research,Bangalore,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Samarjit","family":"Chakraborty","sequence":"additional","affiliation":[{"name":"University of North Carolina,Department of Computer Science,Chapel Hill"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-17502-3_22"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-71500-7_17"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/2379776.2379787"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTW.2011.100"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-54862-8_26"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-54862-8_31"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-78800-3_24"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/11916277_38"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-45234-6_29"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-71500-7_20"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.14722\/ndss.2016.23368"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/3243734.3243804"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-89960-2_12"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-10575-8"},{"key":"ref8","author":"zalewski","year":"0","journal-title":"American Fuzzy Lop"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2491411.2494569"},{"key":"ref2","first-page":"1","article-title":"The art, science, and engineering of fuzzing: A survey","author":"man\u00e8s","year":"2019","journal-title":"IEEE Transactions on Software Engineering"},{"key":"ref9","author":"medicherla","year":"0","journal-title":"Verifuzz 1 2 0"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/3359981"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-79379-1_6"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2013.6693074"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2018.00056"}],"event":{"name":"2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)","location":"Antwerp, Belgium","start":{"date-parts":[[2022,3,14]]},"end":{"date-parts":[[2022,3,23]]}},"container-title":["2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9774496\/9774497\/09774672.pdf?arnumber=9774672","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,11]],"date-time":"2022-07-11T16:05:32Z","timestamp":1657555532000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9774672\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,3,14]]},"references-count":22,"URL":"https:\/\/doi.org\/10.23919\/date54114.2022.9774672","relation":{},"subject":[],"published":{"date-parts":[[2022,3,14]]}}}