{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T17:10:16Z","timestamp":1772039416901,"version":"3.50.1"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,3,14]],"date-time":"2022-03-14T00:00:00Z","timestamp":1647216000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,3,14]],"date-time":"2022-03-14T00:00:00Z","timestamp":1647216000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100002347","name":"German Federal Ministry of Education and Research (BMBF)","doi-asserted-by":"publisher","award":["16ME0127"],"award-info":[{"award-number":["16ME0127"]}],"id":[{"id":"10.13039\/501100002347","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,3,14]]},"DOI":"10.23919\/date54114.2022.9774771","type":"proceedings-article","created":{"date-parts":[[2022,5,19]],"date-time":"2022-05-19T20:35:05Z","timestamp":1652992505000},"page":"1123-1126","source":"Crossref","is-referenced-by-count":7,"title":["Cross-Level Processor Verification via Endless Randomized Instruction Stream Generation with Coverage-guided Aging"],"prefix":"10.23919","author":[{"given":"Niklas","family":"Bruns","sequence":"first","affiliation":[{"name":"Institute of Computer Science, University of Bremen,Bremen,Germany,28359"}]},{"given":"Vladimir","family":"Herdt","sequence":"additional","affiliation":[{"name":"Institute of Computer Science, University of Bremen,Bremen,Germany,28359"}]},{"given":"Eyck","family":"Jentzsch","sequence":"additional","affiliation":[{"name":"MINRES Technologies GmbH,Neubiberg,Germany,85579"}]},{"given":"Rolf","family":"Drechsler","sequence":"additional","affiliation":[{"name":"Institute of Computer Science, University of Bremen,Bremen,Germany,28359"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-19583-9_13"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/1572272.1572303"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/2656106.2656113"},{"key":"ref13","year":"0","journal-title":"RISC-V Torture Test Generator"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.23919\/DATE48585.2020.9116193"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8714912"},{"key":"ref16","year":"0","journal-title":"RISC-V ISA Tests"},{"key":"ref17","year":"0","journal-title":"RISC- V compliance task group"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/LES.2021.3077368"},{"key":"ref19","year":"2020","journal-title":"RISC-V formal verification framework"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.1277900"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/FDL50818.2020.9232941"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176425"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-10702-8_13"},{"key":"ref8","first-page":"1","article-title":"Rapid prototyping and compact testing of CPU emulators","author":"ma","year":"2010","journal-title":"RSP"},{"key":"ref7","article-title":"Mi-croTESK: specification-based tool for constructing test program gen-erators","author":"chupilko","year":"2017","journal-title":"HVC"},{"key":"ref2","article-title":"The RISC- V Instruction Set Manual","volume":"ii","author":"waterman","year":"2019","journal-title":"Privileged Archi-tecture"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775907"},{"key":"ref1","article-title":"The RISC- V Instruction Set Manual","volume":"i","author":"waterman","year":"2019","journal-title":"Unprivileged ISA"},{"key":"ref20","year":"2020","journal-title":"OneSpin 360 DV RISC-V Verification App"}],"event":{"name":"2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)","location":"Antwerp, Belgium","start":{"date-parts":[[2022,3,14]]},"end":{"date-parts":[[2022,3,23]]}},"container-title":["2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9774496\/9774497\/09774771.pdf?arnumber=9774771","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,11]],"date-time":"2022-07-11T20:05:35Z","timestamp":1657569935000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9774771\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,3,14]]},"references-count":20,"URL":"https:\/\/doi.org\/10.23919\/date54114.2022.9774771","relation":{},"subject":[],"published":{"date-parts":[[2022,3,14]]}}}