{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,4]],"date-time":"2025-12-04T10:05:50Z","timestamp":1764842750011,"version":"3.28.0"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,4]]},"DOI":"10.23919\/date56975.2023.10136984","type":"proceedings-article","created":{"date-parts":[[2023,6,2]],"date-time":"2023-06-02T19:32:57Z","timestamp":1685734377000},"page":"1-6","source":"Crossref","is-referenced-by-count":5,"title":["Hardware Trojans in eNVM Neuromorphic Devices"],"prefix":"10.23919","author":[{"given":"Lingxi","family":"Wu","sequence":"first","affiliation":[{"name":"University of Virginia,Department of Computer Science"}]},{"given":"Rahul","family":"Sreekumar","sequence":"additional","affiliation":[{"name":"University of Virginia,Department of Electrical and Computer Engineering"}]},{"given":"Rasool","family":"Sharifi","sequence":"additional","affiliation":[{"name":"University of Virginia,Department of Computer Science"}]},{"given":"Kevin","family":"Skadron","sequence":"additional","affiliation":[{"name":"University of Virginia,Department of Computer Science"}]},{"given":"Mircea R.","family":"Stant","sequence":"additional","affiliation":[{"name":"University of Virginia,Department of Electrical and Computer Engineering"}]},{"given":"Ashish","family":"Venkat","sequence":"additional","affiliation":[{"name":"University of Virginia,Department of Computer Science"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD45719.2019.8942041"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s41635-021-00110-8"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/3274694.3274696"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.261"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2010.18"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2966986.2967074"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2009.5224971"},{"key":"ref21","first-page":"19","article-title":"Adaptive masking: a dynamic trade-off between energy consumption and hardware security","author":"montoya","year":"0","journal-title":"ICCD"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2017.8268337"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACSSC.2017.8335698"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2020.2994272"},{"key":"ref16","first-page":"8","article-title":"Power supply signal calibration techniques for improving detection resolution to hardware trojans","author":"tehranipoor","year":"0","journal-title":"ICCAD"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/2508859.2516654"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-04138-9_28"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2015.2426495"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3007787.3001139"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2015.7169073"},{"key":"ref4","article-title":"Stealing machine learning models via prediction apis","volume":"16","author":"tram\u00e8r","year":"0","journal-title":"Usenix Security"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2016.10"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2789723"},{"journal-title":"IBM advances research in analog ai computing","year":"0","key":"ref5"}],"event":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2023,4,17]]},"location":"Antwerp, Belgium","end":{"date-parts":[[2023,4,19]]}},"container-title":["2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10136870\/10136706\/10136984.pdf?arnumber=10136984","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,26]],"date-time":"2023-06-26T17:53:11Z","timestamp":1687801991000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10136984\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,4]]},"references-count":21,"URL":"https:\/\/doi.org\/10.23919\/date56975.2023.10136984","relation":{},"subject":[],"published":{"date-parts":[[2023,4]]}}}