{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,13]],"date-time":"2026-03-13T15:19:49Z","timestamp":1773415189857,"version":"3.50.1"},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,4]]},"DOI":"10.23919\/date56975.2023.10137060","type":"proceedings-article","created":{"date-parts":[[2023,6,2]],"date-time":"2023-06-02T19:32:57Z","timestamp":1685734377000},"page":"1-6","source":"Crossref","is-referenced-by-count":6,"title":["Liveness-Aware Checkpointing of Arrays for Efficient Intermittent Computing"],"prefix":"10.23919","author":[{"given":"Youngbin","family":"Kim","sequence":"first","affiliation":[{"name":"Electronics and Telecommunications Research Institute (ETRI),Daejeon,Republic of Korea"}]},{"given":"Yoojin","family":"Lim","sequence":"additional","affiliation":[{"name":"Electronics and Telecommunications Research Institute (ETRI),Daejeon,Republic of Korea"}]},{"given":"Chaedeok","family":"Lim","sequence":"additional","affiliation":[{"name":"Electronics and Telecommunications Research Institute (ETRI),Daejeon,Republic of Korea"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/3055031.3055082"},{"key":"ref12","first-page":"85","article-title":"Time-sensitive intermittent computing meets legacy soft-ware","author":"kortbeek","year":"2020","journal-title":"ASPLOS"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2016.2547919"},{"key":"ref14","article-title":"Hibernus: Sustaining computation during intermittent supply for energy-harvesting systems","volume":"7","author":"balsamo","year":"2014","journal-title":"ESL"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CGO.2004.1281665"},{"key":"ref11","author":"darte","year":"2016","journal-title":"Liveness Analysis in Explicitly-Parallel Programs"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/WWC.2001.990739"},{"key":"ref10","article-title":"Storage size reduction by in-place mapping of arrays","author":"tron\u00e7on","year":"2002","journal-title":"VMCAI"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/190347.190423"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/3131672.3131699"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/RTAS54340.2022.00012"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/3385412.3385998"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/3314221.3314613"},{"key":"ref19","article-title":"Intermittent computing: Challenges and opportunities","author":"lucia","year":"2017","journal-title":"SnAP"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/3519939.3523454"},{"key":"ref8","first-page":"137","article-title":"Efficient state retention for transiently-powered embedded sensing","author":"bhatti","year":"2016","journal-title":"EWSN"},{"key":"ref7","first-page":"1","article-title":"Incremental checkpointing of program state to nvram for transiently-powered systems","author":"aouda","year":"0","journal-title":"ReCoSoC"},{"key":"ref9","first-page":"17","article-title":"Intermittent computation without hardware support or programmer intervention","author":"van der woude","year":"2016","journal-title":"OSDI"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3391903"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/3316482.3326357"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/1950365.1950386"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10080879"}],"event":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","location":"Antwerp, Belgium","start":{"date-parts":[[2023,4,17]]},"end":{"date-parts":[[2023,4,19]]}},"container-title":["2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10136870\/10136706\/10137060.pdf?arnumber=10137060","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,26]],"date-time":"2023-06-26T17:53:22Z","timestamp":1687802002000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10137060\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,4]]},"references-count":22,"URL":"https:\/\/doi.org\/10.23919\/date56975.2023.10137060","relation":{},"subject":[],"published":{"date-parts":[[2023,4]]}}}