{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,21]],"date-time":"2025-11-21T11:30:50Z","timestamp":1763724650132},"reference-count":3,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,4]]},"DOI":"10.23919\/date56975.2023.10137135","type":"proceedings-article","created":{"date-parts":[[2023,6,2]],"date-time":"2023-06-02T19:32:57Z","timestamp":1685734377000},"page":"1-2","source":"Crossref","is-referenced-by-count":1,"title":["Efficient Design Rule Checking with GPU Acceleration"],"prefix":"10.23919","author":[{"given":"Wei","family":"Zhong","sequence":"first","affiliation":[{"name":"DUT"}]},{"given":"Zhenhua","family":"Feng","sequence":"additional","affiliation":[{"name":"DUT"}]},{"given":"Zhuolun","family":"He","sequence":"additional","affiliation":[{"name":"CUHK"}]},{"given":"Weimin","family":"Wang","sequence":"additional","affiliation":[{"name":"DUT"}]},{"given":"Yuzhe","family":"Ma","sequence":"additional","affiliation":[{"name":"HKUST(GZ)"}]},{"given":"Bei","family":"Yu","sequence":"additional","affiliation":[{"name":"CUHK"}]}],"member":"263","reference":[{"journal-title":"FreePDK45","year":"0","key":"ref3"},{"journal-title":"KLayout","year":"0","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/3316781.3326334"}],"event":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2023,4,17]]},"location":"Antwerp, Belgium","end":{"date-parts":[[2023,4,19]]}},"container-title":["2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10136870\/10136706\/10137135.pdf?arnumber=10137135","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,25]],"date-time":"2023-09-25T17:49:53Z","timestamp":1695664193000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10137135\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,4]]},"references-count":3,"URL":"https:\/\/doi.org\/10.23919\/date56975.2023.10137135","relation":{},"subject":[],"published":{"date-parts":[[2023,4]]}}}