{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:37:47Z","timestamp":1740101867471,"version":"3.37.3"},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001659","name":"Deutsche Forschungs-gemeinschaft (DFG, German Research Foundation)","doi-asserted-by":"publisher","award":["146371743 - TRR 89"],"award-info":[{"award-number":["146371743 - TRR 89"]}],"id":[{"id":"10.13039\/501100001659","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,4]]},"DOI":"10.23919\/date56975.2023.10137137","type":"proceedings-article","created":{"date-parts":[[2023,6,2]],"date-time":"2023-06-02T19:32:57Z","timestamp":1685734377000},"page":"1-2","source":"Crossref","is-referenced-by-count":1,"title":["Extended Abstract: Monitoring-based Thermal Management for Mixed-Criticality Systems"],"prefix":"10.23919","author":[{"given":"Marcel","family":"Mettler","sequence":"first","affiliation":[{"name":"Technical University of Munich,Chair of Electronic Design Automation,Germany"}]},{"given":"Martin","family":"Rapp","sequence":"additional","affiliation":[{"name":"Karlsruhe Institute for Technology,Chair for Embedded Systems,Germany"}]},{"given":"Heba","family":"Khdr","sequence":"additional","affiliation":[{"name":"Karlsruhe Institute for Technology,Chair for Embedded Systems,Germany"}]},{"given":"Daniel","family":"Mueller-Gritschneder","sequence":"additional","affiliation":[{"name":"Technical University of Munich,Chair of Electronic Design Automation,Germany"}]},{"given":"J\u00f6rg","family":"Renkel","sequence":"additional","affiliation":[{"name":"Karlsruhe Institute for Technology,Chair for Embedded Systems,Germany"}]},{"given":"Ulf","family":"Schlichtmann","sequence":"additional","affiliation":[{"name":"Technical University of Munich,Chair of Electronic Design Automation,Germany"}]}],"member":"263","reference":[{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2016.2595560"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/1013235.1013282"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.future.2021.12.002"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2018.2875986"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3516825"},{"journal-title":"British Standards Institution London UK Standard","article-title":"Functional safety of electrical\/electronic\/ programmable electronic safety-related systems","year":"2010","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1142\/S0218126619300071"}],"event":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2023,4,17]]},"location":"Antwerp, Belgium","end":{"date-parts":[[2023,4,19]]}},"container-title":["2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10136870\/10136706\/10137137.pdf?arnumber=10137137","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,25]],"date-time":"2023-09-25T17:49:32Z","timestamp":1695664172000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10137137\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,4]]},"references-count":7,"URL":"https:\/\/doi.org\/10.23919\/date56975.2023.10137137","relation":{},"subject":[],"published":{"date-parts":[[2023,4]]}}}