{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,27]],"date-time":"2025-11-27T13:57:04Z","timestamp":1764251824070},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,4]]},"DOI":"10.23919\/date56975.2023.10137146","type":"proceedings-article","created":{"date-parts":[[2023,6,2]],"date-time":"2023-06-02T19:32:57Z","timestamp":1685734377000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["Fault Model Analysis of DRAM under Electromagnetic Fault Injection Attack"],"prefix":"10.23919","author":[{"given":"Qiang","family":"Liu","sequence":"first","affiliation":[{"name":"School of Microelectronics, Tianjin University,Tianjin,China"}]},{"given":"Longtao","family":"Guo","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Tianjin University,Tianjin,China"}]},{"given":"Honghui","family":"Tang","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Tianjin University,Tianjin,China"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/AsianHOST51057.2020.9358270"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.3003287"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/WIFS49906.2020.9360902"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2021.3117512"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2019.8741030"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IAEAC50856.2021.9390993"},{"key":"ref1","first-page":"29","article-title":"Advanced Far Field EM Side-Channel Attack on AES","author":"wang","year":"2021","journal-title":"Proceedings of the 7th ACM on Cyber-Physical System Security Workshop"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2020.i2.172-195"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2019.00009"},{"key":"ref9","article-title":"BADFET: Defeating modern secure boot using Second-Order pulsed electromagnetic fault injection","author":"cui","year":"2017","journal-title":"11th USENIX Workshop on Offensive Technologies (WOOT 17)"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-10-1387-4_5"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2019.i2.199-224"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED48828.2020.9137051"},{"journal-title":"Electromagnetic Fault Injection on Two Microcontrollers Methodology Fault Model Attack and Countermeasures","year":"2020","author":"haohao","key":"ref5"}],"event":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2023,4,17]]},"location":"Antwerp, Belgium","end":{"date-parts":[[2023,4,19]]}},"container-title":["2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10136870\/10136706\/10137146.pdf?arnumber=10137146","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,26]],"date-time":"2023-06-26T17:53:14Z","timestamp":1687801994000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10137146\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,4]]},"references-count":14,"URL":"https:\/\/doi.org\/10.23919\/date56975.2023.10137146","relation":{},"subject":[],"published":{"date-parts":[[2023,4]]}}}