{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,18]],"date-time":"2025-12-18T14:22:43Z","timestamp":1766067763793,"version":"3.37.3"},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100009534","name":"University of Stuttgart","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100009534","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,4]]},"DOI":"10.23919\/date56975.2023.10137162","type":"proceedings-article","created":{"date-parts":[[2023,6,2]],"date-time":"2023-06-02T19:32:57Z","timestamp":1685734377000},"page":"1-6","source":"Crossref","is-referenced-by-count":11,"title":["Upheaving Self-Heating Effects from Transistor to Circuit Level using Conventional EDA Tool Flows"],"prefix":"10.23919","author":[{"given":"Florian","family":"Klemme","sequence":"first","affiliation":[{"name":"University of Stuttgart,Germany"}]},{"given":"Sami","family":"Salamin","sequence":"additional","affiliation":[{"name":"Hyperstone Company,Konstanz,Germany"}]},{"given":"Hussam","family":"Amrouch","sequence":"additional","affiliation":[{"name":"University of Stuttgart,Germany"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2882229"},{"journal-title":"zero-riscy RISC-V Core","year":"2018","author":"platform","key":"ref12"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ITC50571.2021.00011"},{"key":"ref11","article-title":"The epfl combinational benchmark suite","author":"amaru","year":"2015","journal-title":"Proceedings of the 24th International Workshop on Logic & Synthesis (IWLS)"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/2717764.2717783"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VTS50974.2021.9441002"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2019.2911085"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2015.7313862"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3057900"},{"key":"ref9","first-page":"3","article-title":"A 14nm logic technology featuring 2nd-generation finfet, air-gapped interconnects, self-aligned double patterning and a 0.0588 ?m 2 sram cell size","author":"natarajan","year":"0","journal-title":"2014 IEEE International Electron Devices Meeting"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2018.2801301"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2017.2674658"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2019.2959700"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2019.8854405"}],"event":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2023,4,17]]},"location":"Antwerp, Belgium","end":{"date-parts":[[2023,4,19]]}},"container-title":["2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10136870\/10136706\/10137162.pdf?arnumber=10137162","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,25]],"date-time":"2023-09-25T17:49:11Z","timestamp":1695664151000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10137162\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,4]]},"references-count":14,"URL":"https:\/\/doi.org\/10.23919\/date56975.2023.10137162","relation":{},"subject":[],"published":{"date-parts":[[2023,4]]}}}