{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,31]],"date-time":"2024-10-31T02:42:25Z","timestamp":1730342545213,"version":"3.28.0"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,4]]},"DOI":"10.23919\/date56975.2023.10137190","type":"proceedings-article","created":{"date-parts":[[2023,6,2]],"date-time":"2023-06-02T19:32:57Z","timestamp":1685734377000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["REDRAW: Fast and Efficient Hardware Accelerator with Reduced Reads And Writes for 3D UNet"],"prefix":"10.23919","author":[{"given":"Tom","family":"Glint","sequence":"first","affiliation":[{"name":"IIT Gandhinagar,India"}]},{"given":"Manu","family":"Awasthi","sequence":"additional","affiliation":[{"name":"Ashoka University,India"}]},{"given":"Joycee","family":"Mekie","sequence":"additional","affiliation":[{"name":"IIT Gandhinagar,India"}]}],"member":"263","reference":[{"journal-title":"MLCommons","article-title":"Mlperf edge inference v2.1 results","year":"0","key":"ref13"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6560\/ac7376"},{"key":"ref23","first-page":"28","article-title":"Cacti 6.0: A tool to model large caches","volume":"27","author":"muralimanohar","year":"2009","journal-title":"HP Laboratories"},{"key":"ref15","article-title":"Hardware approximate techniques for deep neural network accelerators: A survey","author":"armeniakos","year":"2022","journal-title":"ACM Computing Surveys (CSUR)"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2960488"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/LES.2022.3158565"},{"journal-title":"3d-unet medical image segmentation for tensorflow Nvidia ngc","year":"0","key":"ref11"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD45719.2019.8942149"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2022.3167449"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISPASS.2019.00042"},{"key":"ref2","article-title":"Mlperf training benchmark","author":"mattson","year":"2019","journal-title":"ArXiv Preprint"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.eng.2020.01.007"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2018.8502404"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870353"},{"key":"ref19","first-page":"130","article-title":"7.1 an 11.5 tops\/w 1024-mac butterfly structure dual-core sparsity-aware neural processing unit in 8nm flagship mobile soc","author":"song","year":"0","journal-title":"2019 IEEE International Solid-State Circuits Conference-(ISSCC) IEEE"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310262"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA45697.2020.00045"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6560\/ab039b"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3296957.3173176"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2018.00080"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.sysarc.2021.102041"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/mp.15555"},{"key":"ref5","first-page":"424","article-title":"3d u-net: learning dense volumetric segmentation from sparse annotation","author":"\u00e7i\u00e7ek","year":"0","journal-title":"International Conference on Medical Image Computing and Computer-Assisted Intervention"}],"event":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2023,4,17]]},"location":"Antwerp, Belgium","end":{"date-parts":[[2023,4,19]]}},"container-title":["2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10136870\/10136706\/10137190.pdf?arnumber=10137190","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,7,17]],"date-time":"2023-07-17T17:31:03Z","timestamp":1689615063000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10137190\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,4]]},"references-count":23,"URL":"https:\/\/doi.org\/10.23919\/date56975.2023.10137190","relation":{},"subject":[],"published":{"date-parts":[[2023,4]]}}}