{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,7]],"date-time":"2026-01-07T08:07:36Z","timestamp":1767773256783},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,4]]},"DOI":"10.23919\/date56975.2023.10137244","type":"proceedings-article","created":{"date-parts":[[2023,6,2]],"date-time":"2023-06-02T19:32:57Z","timestamp":1685734377000},"source":"Crossref","is-referenced-by-count":12,"title":["Pruning and Early-Exit Co-Optimization for CNN Acceleration on FPGAs"],"prefix":"10.23919","author":[{"given":"Guilherme","family":"Korol","sequence":"first","affiliation":[{"name":"Institute of Informatics, Universidade Federal do Rio Grande do Sul (UFRGS),Porto Alegre,Brazil"}]},{"given":"Michael Guilherme","family":"Jordan","sequence":"additional","affiliation":[{"name":"Institute of Informatics, Universidade Federal do Rio Grande do Sul (UFRGS),Porto Alegre,Brazil"}]},{"given":"Mateus Beck","family":"Rutzig","sequence":"additional","affiliation":[{"name":"Universidade Federal de Santa Maria (UFSM),Electronics and Computing Department,Santa Maria,Brazil"}]},{"given":"Jeronimo","family":"Castrillon","sequence":"additional","affiliation":[{"name":"Center for Advancing Electronics Dresden, TU Dresden,Dresden,Germany"}]},{"given":"Antonio Carlos Schneider","family":"Beck","sequence":"additional","affiliation":[{"name":"Institute of Informatics, Universidade Federal do Rio Grande do Sul (UFRGS),Porto Alegre,Brazil"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2018.00025"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/3289602.3293915"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/HPEC.2019.8916237"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/3400302.3415698"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/3316781.3317829"},{"key":"ref10","first-page":"244","article-title":"Adaflow: A framework for adaptive dataflow CNN acceleration on fpgas","year":"2022","journal-title":"DATE"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/3316781.3324696"},{"key":"ref1","first-page":"84","article-title":"FlexDNN: Input-Adaptive On-Device Deep Learning for Efficient Mobile Vision","author":"fang","year":"2020","journal-title":"Sec"},{"key":"ref17","first-page":"446","article-title":"Mlperf inference benchmark","author":"reddi","year":"2020","journal-title":"ISCA"},{"key":"ref16","first-page":"178","article-title":"Dynexit: A dynamic early-exit strategy for deep residual networks","author":"wang","year":"2019","journal-title":"SIPS"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ASAP49362.2020.00040"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3850\/9783981537079_0819"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3476990"},{"key":"ref4","article-title":"Pruning filters for efficient convnets","author":"li","year":"2017","journal-title":"ICLR OpenRe- view net"},{"key":"ref3","first-page":"945","article-title":"Anytimenet: Controlling time-quality tradeoffs in deep neural network architectures","author":"kim","year":"2020","journal-title":"DATE"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3242897"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICPR.2016.7900006"}],"event":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","location":"Antwerp, Belgium","start":{"date-parts":[[2023,4,17]]},"end":{"date-parts":[[2023,4,19]]}},"container-title":["2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10136870\/10136706\/10137244.pdf?arnumber=10137244","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,12,4]],"date-time":"2023-12-04T18:40:43Z","timestamp":1701715243000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10137244\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,4]]},"references-count":17,"URL":"https:\/\/doi.org\/10.23919\/date56975.2023.10137244","relation":{},"subject":[],"published":{"date-parts":[[2023,4]]}}}