{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,15]],"date-time":"2024-08-15T00:24:49Z","timestamp":1723681489776},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,3,25]],"date-time":"2024-03-25T00:00:00Z","timestamp":1711324800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,3,25]],"date-time":"2024-03-25T00:00:00Z","timestamp":1711324800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,3,25]]},"DOI":"10.23919\/date58400.2024.10546594","type":"proceedings-article","created":{"date-parts":[[2024,8,14]],"date-time":"2024-08-14T17:28:02Z","timestamp":1723656482000},"page":"1-2","source":"Crossref","is-referenced-by-count":0,"title":["In-Field Detection of Small Delay Defects and Runtime Degradation Using On-Chip Sensors"],"prefix":"10.23919","author":[{"given":"S. Maryam","family":"Ghasemi","sequence":"first","affiliation":[{"name":"Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT),Karlsruhe,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sergej","family":"Meschkov","sequence":"additional","affiliation":[{"name":"Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT),Karlsruhe,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jonas","family":"Krautter","sequence":"additional","affiliation":[{"name":"Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT),Karlsruhe,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dennis R. E.","family":"Gnad","sequence":"additional","affiliation":[{"name":"Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT),Karlsruhe,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mehdi B.","family":"Tahoori","sequence":"additional","affiliation":[{"name":"Institute of Computer Engineering, Karlsruhe Institute of Technology (KIT),Karlsruhe,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","event":{"name":"2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)","location":"Valencia, Spain","start":{"date-parts":[[2024,3,25]]},"end":{"date-parts":[[2024,3,27]]}},"container-title":["2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10546498\/10546499\/10546594.pdf?arnumber=10546594","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,14]],"date-time":"2024-08-14T17:31:35Z","timestamp":1723656695000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10546594\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,3,25]]},"references-count":0,"URL":"https:\/\/doi.org\/10.23919\/date58400.2024.10546594","relation":{},"subject":[],"published":{"date-parts":[[2024,3,25]]}}}