{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,16]],"date-time":"2024-08-16T00:23:11Z","timestamp":1723767791406},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,3,25]],"date-time":"2024-03-25T00:00:00Z","timestamp":1711324800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,3,25]],"date-time":"2024-03-25T00:00:00Z","timestamp":1711324800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,3,25]]},"DOI":"10.23919\/date58400.2024.10546666","type":"proceedings-article","created":{"date-parts":[[2024,8,14]],"date-time":"2024-08-14T17:28:02Z","timestamp":1723656482000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["High Throughput Hardware Accelerated CoreSight Trace Decoding"],"prefix":"10.23919","author":[{"given":"Matthew Edwin","family":"Weingarten","sequence":"first","affiliation":[{"name":"Systems Group, D-INFK, ETH Zurich,Zurich,Switzerland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nora","family":"Hossle","sequence":"additional","affiliation":[{"name":"Systems Group, D-INFK, ETH Zurich,Zurich,Switzerland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Timothy","family":"Roscoe","sequence":"additional","affiliation":[{"name":"Systems Group, D-INFK, ETH Zurich,Zurich,Switzerland"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"volume-title":"ARM Ltd. Embedded Trace Macrocell Architecture Specification ETMv4.0 to ETM4.6 ARM IHI0064H","year":"2020","key":"ref1"},{"volume-title":"ARM Ltd. ARM\u00ae CoreSight\u2122 SoC-400 DDI0480G","year":"2015","key":"ref2"},{"key":"ref3","first-page":"12","article-title":"AutoFDO: Automatic feedback-directed optimization for warehouse-scale applications","volume-title":"Proceedings of the 2016 International Symposium on Code Generation and Optimization","author":"Chen"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3503222.3507742"},{"volume-title":"Coresight AutoFDO Collect ETM data for AutoFDO","year":"2023","key":"ref5"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-70848-5_12"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-17196-3_20"},{"volume-title":"Linaro\/opencsd: Coresight Trace Stream decoder developed openly","key":"ref8"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3314221.3314637"},{"volume-title":"Runtime verification with tessla on enzian","year":"2019","author":"Schmid","key":"ref10"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s41635-023-00133-3"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VDAT.2011.5783594"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1002\/cpe.4069"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1049\/iet-sen:20060076"},{"volume-title":"Hardware Accelerated Trace Analysis for Com-piler Optimizations","year":"2023","author":"Edwin Weingarten","key":"ref15"},{"volume-title":"Trace-data processing and profiling device","year":"2016","author":"Weiss","key":"ref16"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.23919\/DATE51398.2021.9474035"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2020.3002145"}],"event":{"name":"2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2024,3,25]]},"location":"Valencia, Spain","end":{"date-parts":[[2024,3,27]]}},"container-title":["2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10546498\/10546499\/10546666.pdf?arnumber=10546666","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,15]],"date-time":"2024-08-15T04:31:05Z","timestamp":1723696265000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10546666\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,3,25]]},"references-count":18,"URL":"https:\/\/doi.org\/10.23919\/date58400.2024.10546666","relation":{},"subject":[],"published":{"date-parts":[[2024,3,25]]}}}