{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,24]],"date-time":"2026-03-24T15:18:58Z","timestamp":1774365538434,"version":"3.50.1"},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,3,25]],"date-time":"2024-03-25T00:00:00Z","timestamp":1711324800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,3,25]],"date-time":"2024-03-25T00:00:00Z","timestamp":1711324800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,3,25]]},"DOI":"10.23919\/date58400.2024.10546683","type":"proceedings-article","created":{"date-parts":[[2024,8,14]],"date-time":"2024-08-14T17:28:02Z","timestamp":1723656482000},"page":"1-2","source":"Crossref","is-referenced-by-count":2,"title":["Towards Atomic Defect-Aware Physical Design of Silicon Dangling Bond Logic on the H -Si $(100)-2\\times 1$ Surface"],"prefix":"10.23919","author":[{"given":"Marcel","family":"Walter","sequence":"first","affiliation":[{"name":"Technical University of Munich,Chair for Design Automation,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jeremiah","family":"Croshaw","sequence":"additional","affiliation":[{"name":"University of Alberta,Department of Physics,Edmonton,Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Samuel Sze","family":"Hang Ng","sequence":"additional","affiliation":[{"name":"University of British Columbia,Department of Electrical and Computer Engineering,Vancouver,Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Konrad","family":"Walus","sequence":"additional","affiliation":[{"name":"University of British Columbia,Department of Electrical and Computer Engineering,Vancouver,Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Robert","family":"Wolkow","sequence":"additional","affiliation":[{"name":"University of Alberta,Department of Physics,Edmonton,Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Robert","family":"Wille","sequence":"additional","affiliation":[{"name":"Technical University of Munich,Chair for Design Automation,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-018-0180-3"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3762\/bjnano.11.119"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.9b04653"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3489517.3530525"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/2632-2153\/ab6d5e"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2020.2966162"},{"key":"ref7","volume-title":"Charged Defect Simulation in SiDB Systems","author":"Ng","year":"2022"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/nano58406.2023.10231266"},{"key":"ref9","volume-title":"Automated Atomic Silicon Quantum Dot Circuit Design via Deep Reinforcement Learning","author":"Lupoiu","year":"2022"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/1116696.1116697"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342060"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/3287624.3287705"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.7b04238"}],"event":{"name":"2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)","location":"Valencia, Spain","start":{"date-parts":[[2024,3,25]]},"end":{"date-parts":[[2024,3,27]]}},"container-title":["2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10546498\/10546499\/10546683.pdf?arnumber=10546683","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,15]],"date-time":"2024-08-15T04:31:26Z","timestamp":1723696286000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10546683\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,3,25]]},"references-count":13,"URL":"https:\/\/doi.org\/10.23919\/date58400.2024.10546683","relation":{},"subject":[],"published":{"date-parts":[[2024,3,25]]}}}