{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,15]],"date-time":"2024-08-15T00:23:26Z","timestamp":1723681406288},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,3,25]],"date-time":"2024-03-25T00:00:00Z","timestamp":1711324800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,3,25]],"date-time":"2024-03-25T00:00:00Z","timestamp":1711324800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["T2293700,T2293701,T2293704"],"award-info":[{"award-number":["T2293700,T2293701,T2293704"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,3,25]]},"DOI":"10.23919\/date58400.2024.10546819","type":"proceedings-article","created":{"date-parts":[[2024,8,14]],"date-time":"2024-08-14T17:28:02Z","timestamp":1723656482000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["VACSEM: Verifying Average Errors in Approximate Circuits Using Simulation-Enhanced Model Counting"],"prefix":"10.23919","author":[{"given":"Chang","family":"Meng","sequence":"first","affiliation":[{"name":"EPFL,Integrated Systems Laboratory,Lausanne,Switzerland"}]},{"given":"Hanyu","family":"Wang","sequence":"additional","affiliation":[{"name":"ETH Zurich,Department of Information Technology and Electrical Engineering,Zurich,Switzerland"}]},{"given":"Yuqi","family":"Mai","sequence":"additional","affiliation":[{"name":"UM-SJTU Joint Institute, Shanghai Jiao Tong University,Shanghai,China"}]},{"given":"Weikang","family":"Qian","sequence":"additional","affiliation":[{"name":"UM-SJTU Joint Institute, Shanghai Jiao Tong University,Shanghai,China"}]},{"given":"Giovanni","family":"De Micheli","sequence":"additional","affiliation":[{"name":"EPFL,Integrated Systems Laboratory,Lausanne,Switzerland"}]}],"member":"263","event":{"name":"2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)","location":"Valencia, Spain","start":{"date-parts":[[2024,3,25]]},"end":{"date-parts":[[2024,3,27]]}},"container-title":["2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10546498\/10546499\/10546819.pdf?arnumber=10546819","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,14]],"date-time":"2024-08-14T17:28:43Z","timestamp":1723656523000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10546819\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,3,25]]},"references-count":0,"URL":"https:\/\/doi.org\/10.23919\/date58400.2024.10546819","relation":{},"subject":[],"published":{"date-parts":[[2024,3,25]]}}}