{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,21]],"date-time":"2025-11-21T11:32:43Z","timestamp":1763724763475},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,3,25]],"date-time":"2024-03-25T00:00:00Z","timestamp":1711324800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,3,25]],"date-time":"2024-03-25T00:00:00Z","timestamp":1711324800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100002347","name":"Federal Ministry of Education and Research","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002347","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,3,25]]},"DOI":"10.23919\/date58400.2024.10546825","type":"proceedings-article","created":{"date-parts":[[2024,8,14]],"date-time":"2024-08-14T17:28:02Z","timestamp":1723656482000},"page":"1-6","source":"Crossref","is-referenced-by-count":6,"title":["REDCAP: Reconfigurable RFET-Based Circuits Against Power Side-Channel Attacks"],"prefix":"10.23919","author":[{"given":"Nima","family":"Kavand","sequence":"first","affiliation":[{"name":"TU Dresden,Chair of Processor Design,Germany"}]},{"given":"Armin","family":"Darjani","sequence":"additional","affiliation":[{"name":"TU Dresden,Chair of Processor Design,Germany"}]},{"given":"Giulio","family":"Galderisi","sequence":"additional","affiliation":[{"name":"NaMLab gGmbH,Germany"}]},{"given":"Jens","family":"Trommer","sequence":"additional","affiliation":[{"name":"NaMLab gGmbH,Germany"}]},{"given":"Thomas","family":"Mikolajick","sequence":"additional","affiliation":[{"name":"NaMLab gGmbH,Germany"}]},{"given":"Akash","family":"Kumar","sequence":"additional","affiliation":[{"name":"TU Dresden,Chair of Processor Design,Germany"}]}],"member":"263","event":{"name":"2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)","location":"Valencia, Spain","start":{"date-parts":[[2024,3,25]]},"end":{"date-parts":[[2024,3,27]]}},"container-title":["2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10546498\/10546499\/10546825.pdf?arnumber=10546825","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,14]],"date-time":"2024-08-14T17:31:06Z","timestamp":1723656666000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10546825\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,3,25]]},"references-count":0,"URL":"https:\/\/doi.org\/10.23919\/date58400.2024.10546825","relation":{},"subject":[],"published":{"date-parts":[[2024,3,25]]}}}