{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,26]],"date-time":"2025-11-26T16:49:53Z","timestamp":1764175793078,"version":"3.41.0"},"reference-count":32,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T00:00:00Z","timestamp":1743379200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T00:00:00Z","timestamp":1743379200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100000780","name":"European Union","doi-asserted-by":"publisher","award":["101135316"],"award-info":[{"award-number":["101135316"]}],"id":[{"id":"10.13039\/501100000780","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002957","name":"TU Dresden","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002957","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,3,31]]},"DOI":"10.23919\/date64628.2025.10992831","type":"proceedings-article","created":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T17:36:35Z","timestamp":1747848995000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Multi-Partner Project: Smart Sensor Analog Front-Ends Powered by Emerging Reconfigurable Devices (SENSOTERIC)"],"prefix":"10.23919","author":[{"given":"Giulio","family":"Galderisi","sequence":"first","affiliation":[{"name":"NaMLab gGmbH,Dresden,Germany"}]},{"given":"Andreas","family":"Kramer","sequence":"additional","affiliation":[{"name":"TU Darmstadt,Integrated Electronic Systems Lab,Darmstadt,Germany"}]},{"given":"Andreas","family":"Fuchsberger","sequence":"additional","affiliation":[{"name":"Institute of Solid State Electronics, TU Vienna,Vienna,Austria"}]},{"given":"Jose Maria","family":"Gonzalez-Medina","sequence":"additional","affiliation":[{"name":"Global TCAD Solutions GmbH,Vienna,Austria"}]},{"given":"Yuxuan","family":"He","sequence":"additional","affiliation":[{"name":"NaMLab gGmbH,Dresden,Germany"}]},{"given":"Lee-Chi","family":"Hung","sequence":"additional","affiliation":[{"name":"Global TCAD Solutions GmbH,Vienna,Austria"}]},{"given":"Marrit Jen","family":"Hong Li","sequence":"additional","affiliation":[{"name":"TU Eindhoven,Eindhoven,Netherlands"}]},{"given":"Julian","family":"Kulenkampff","sequence":"additional","affiliation":[{"name":"TU Darmstadt,Integrated Electronic Systems Lab,Darmstadt,Germany"}]},{"given":"Maximilian","family":"Reuter","sequence":"additional","affiliation":[{"name":"TU Darmstadt,Integrated Electronic Systems Lab,Darmstadt,Germany"}]},{"given":"Lukas","family":"Wind","sequence":"additional","affiliation":[{"name":"Institute of Solid State Electronics, TU Vienna,Vienna,Austria"}]},{"given":"Masiar","family":"Sistani","sequence":"additional","affiliation":[{"name":"Institute of Solid State Electronics, TU Vienna,Vienna,Austria"}]},{"given":"Thomas","family":"Mikolajick","sequence":"additional","affiliation":[{"name":"NaMLab gGmbH,Dresden,Germany"}]},{"given":"Bruno","family":"Neckel-Wesling","sequence":"additional","affiliation":[{"name":"NaMLab gGmbH,Dresden,Germany"}]},{"given":"Marina","family":"Deng","sequence":"additional","affiliation":[{"name":"IMS, University of Bordeaux,Bordeaux,France"}]},{"given":"Cristell","family":"Maneux","sequence":"additional","affiliation":[{"name":"IMS, University of Bordeaux,Bordeaux,France"}]},{"given":"Pieter","family":"Harpe","sequence":"additional","affiliation":[{"name":"TU Eindhoven,Eindhoven,Netherlands"}]},{"given":"Sonia Prado","family":"Lopez","sequence":"additional","affiliation":[{"name":"Institute of Solid State Electronics, TU Vienna,Vienna,Austria"}]},{"given":"Oskar","family":"Baumgartner","sequence":"additional","affiliation":[{"name":"Global TCAD Solutions GmbH,Vienna,Austria"}]},{"given":"Chhandak","family":"Mukherjee","sequence":"additional","affiliation":[{"name":"IMS, University of Bordeaux,Bordeaux,France"}]},{"given":"Eugenio","family":"Cantatore","sequence":"additional","affiliation":[{"name":"TU Eindhoven,Eindhoven,Netherlands"}]},{"given":"Sandro","family":"Carrara","sequence":"additional","affiliation":[{"name":"EPFL,Lausanne,Switzerland"}]},{"given":"Klaus","family":"Hofmann","sequence":"additional","affiliation":[{"name":"TU Darmstadt,Integrated Electronic Systems Lab,Darmstadt,Germany"}]},{"given":"Walter M.","family":"Weber","sequence":"additional","affiliation":[{"name":"Institute of Solid State Electronics, TU Vienna,Vienna,Austria"}]},{"given":"Jens","family":"Trommer","sequence":"additional","affiliation":[{"name":"NaMLab gGmbH,Dresden,Germany"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2022.108381"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1088\/2399-1984\/ad92d1"},{"key":"ref3","first-page":"1","article-title":"S2\u20132 back-bias reconfigurable field effect transistor: A flexible add-on functionality for 22 nm fdsoi","volume-title":"2021 Silicon Nanoelectronics Workshop (SNW)","author":"Sessi","year":"2021"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/iedm.2016.7838029"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-022-34533-w"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ESSERC62670.2024.10719591"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CONCAPAN48024.2022.9997726"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1147\/rd.135.0562"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/22\/1\/s01"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.1c06801"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2024.3432971"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2022.3221836"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ESSERC62670.2024.10719561"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/SISPAD62626.2024.10733086"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2952333"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s12633-022-01683-x"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1002\/jnm.3114"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1149\/2162-8777\/ad8c7e"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/s12274-013-0393-8"},{"article-title":"Planar electrostatically doped fdsoi sbfets in application of ammonia detection","volume-title":"Master\u2019s Thesis","author":"Kramer","key":"ref20"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1021\/acsphotonics.1c01359"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2778188"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.3389\/fnins.2022.875656"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3390\/app8060950"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1021\/acs.nanolett.6b01648"},{"first-page":"1997","volume-title":"ADC Performance Survey","author":"Murmann","key":"ref26"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2018.8494250"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2023.3247434"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2611518"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2019.2913013"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2016.7598288"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.2975890"}],"event":{"name":"2025 Design, Automation & Test in Europe Conference (DATE)","start":{"date-parts":[[2025,3,31]]},"location":"Lyon, France","end":{"date-parts":[[2025,4,2]]}},"container-title":["2025 Design, Automation & Test in Europe Conference (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10992638\/10992588\/10992831.pdf?arnumber=10992831","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,22]],"date-time":"2025-05-22T05:50:05Z","timestamp":1747893005000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10992831\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3,31]]},"references-count":32,"URL":"https:\/\/doi.org\/10.23919\/date64628.2025.10992831","relation":{},"subject":[],"published":{"date-parts":[[2025,3,31]]}}}