{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,24]],"date-time":"2026-03-24T15:49:27Z","timestamp":1774367367585,"version":"3.50.1"},"reference-count":28,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T00:00:00Z","timestamp":1743379200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T00:00:00Z","timestamp":1743379200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004826","name":"Beijing Natural Science Foundation","doi-asserted-by":"publisher","award":["Z220003"],"award-info":[{"award-number":["Z220003"]}],"id":[{"id":"10.13039\/501100004826","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,3,31]]},"DOI":"10.23919\/date64628.2025.10992848","type":"proceedings-article","created":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T17:36:35Z","timestamp":1747848995000},"page":"1-7","source":"Crossref","is-referenced-by-count":1,"title":["A Parallel Floating Random Walk Solver for Reproducible and Reliable Capacitance Extraction"],"prefix":"10.23919","author":[{"given":"Jiechen","family":"Huang","sequence":"first","affiliation":[{"name":"Tsinghua University,BNRist,Dept. Computer Science & Tech.,Beijing,China"}]},{"given":"Shuailong","family":"Liu","sequence":"additional","affiliation":[{"name":"Exceeda Inc.,Beijing,China"}]},{"given":"Wenjian","family":"Yu","sequence":"additional","affiliation":[{"name":"Tsinghua University,BNRist,Dept. Computer Science & Tech.,Beijing,China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8714962"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-54298-5"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.enganabound.2004.02.006"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/0038-1101(92)90332-7"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2224346"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2902961.2903011"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3194554.3194568"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.336"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/edssc.2015.7285150"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8714992"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2014.2345391"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.23919\/DATE48585.2020.9116553"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2022.3226402"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/3649329.3658263"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2024.3357592"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.2528\/PIERB21011501"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2023.3235754"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TADVP.2010.2091504"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3850\/9783981537079_0202"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2019.2901255"},{"key":"ref21","volume-title":"Parasitic Extraction Calibre xACT 3D","year":"2024"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/2063384.2063405"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1038\/007478a0"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/363707.363723"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-76526-6"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/272991.272995"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/78.218151"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1137\/1.9780898718881"}],"event":{"name":"2025 Design, Automation & Test in Europe Conference (DATE)","location":"Lyon, France","start":{"date-parts":[[2025,3,31]]},"end":{"date-parts":[[2025,4,2]]}},"container-title":["2025 Design, Automation & Test in Europe Conference (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10992638\/10992588\/10992848.pdf?arnumber=10992848","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,22]],"date-time":"2025-05-22T06:00:30Z","timestamp":1747893630000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10992848\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3,31]]},"references-count":28,"URL":"https:\/\/doi.org\/10.23919\/date64628.2025.10992848","relation":{},"subject":[],"published":{"date-parts":[[2025,3,31]]}}}