{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,23]],"date-time":"2025-05-23T04:05:21Z","timestamp":1747973121017,"version":"3.41.0"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T00:00:00Z","timestamp":1743379200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T00:00:00Z","timestamp":1743379200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea (NRF)","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003836","name":"IC Design Education Center (IDEC), Korea","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003836","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,3,31]]},"DOI":"10.23919\/date64628.2025.10993119","type":"proceedings-article","created":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T17:36:35Z","timestamp":1747848995000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["A Synthesizable Thyristor-Like Leakage-Based True Random Number Generator"],"prefix":"10.23919","author":[{"given":"Seohyun","family":"Kim","sequence":"first","affiliation":[{"name":"Ajou University,Dept. of Intelligent Semiconductor Engineering,Suwon,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jang Hyun","family":"Kim","sequence":"additional","affiliation":[{"name":"Ajou University,Dept. of Intelligent Semiconductor Engineering,Suwon,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jongmin","family":"Lee","sequence":"additional","affiliation":[{"name":"Ajou University,Dept. of Intelligent Semiconductor Engineering,Suwon,Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/SFCS.1994.365700"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2018.8502375"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2014.6946136"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2558490"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870302"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2011.5722301"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2625341"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC56115.2022.9980831"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2017.7927058"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8715257"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2593236"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.23919\/DATE48585.2020.9116307"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.23919\/VLSITechnologyandCir57934.2023.10185323"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC49657.2024.10454373"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310219"}],"event":{"name":"2025 Design, Automation & Test in Europe Conference (DATE)","start":{"date-parts":[[2025,3,31]]},"location":"Lyon, France","end":{"date-parts":[[2025,4,2]]}},"container-title":["2025 Design, Automation & Test in Europe Conference (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10992638\/10992588\/10993119.pdf?arnumber=10993119","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,22]],"date-time":"2025-05-22T05:50:15Z","timestamp":1747893015000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10993119\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3,31]]},"references-count":15,"URL":"https:\/\/doi.org\/10.23919\/date64628.2025.10993119","relation":{},"subject":[],"published":{"date-parts":[[2025,3,31]]}}}