{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,11]],"date-time":"2026-03-11T16:37:53Z","timestamp":1773247073616,"version":"3.50.1"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T00:00:00Z","timestamp":1743379200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T00:00:00Z","timestamp":1743379200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001691","name":"the Grant-in-Aid for Scientific Research (S) from Japan Society for the Promotion of Science (JSPS)","doi-asserted-by":"publisher","award":["24H00073"],"award-info":[{"award-number":["24H00073"]}],"id":[{"id":"10.13039\/501100001691","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,3,31]]},"DOI":"10.23919\/date64628.2025.10993139","type":"proceedings-article","created":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T17:36:35Z","timestamp":1747848995000},"page":"1-7","source":"Crossref","is-referenced-by-count":2,"title":["HachiFI: A Lightweight SoC Architecture-Independent Fault-Injection Framework for SEU Impact Evaluation"],"prefix":"10.23919","author":[{"given":"Quan","family":"Cheng","sequence":"first","affiliation":[{"name":"Kyoto University,Department of Communications and Computer Engineering,Kyoto,Japan"}]},{"given":"Wang","family":"Liao","sequence":"additional","affiliation":[{"name":"School of Systems Engineering, Kochi University of Technology,Kochi,Japan"}]},{"given":"Ruilin","family":"Zhang","sequence":"additional","affiliation":[{"name":"Kyoto University,Department of Communications and Computer Engineering,Kyoto,Japan"}]},{"given":"Hao","family":"Yu","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Southern University of Science and Technology,Shenzhen,China"}]},{"given":"Longyang","family":"Lin","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Southern University of Science and Technology,Shenzhen,China"}]},{"given":"Masanori","family":"Hashimoto","sequence":"additional","affiliation":[{"name":"Kyoto University,Department of Communications and Computer Engineering,Kyoto,Japan"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2021.3131345"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.813129"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI.2008.28"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2021.3131346"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/WiSEE50203.2021.9613828"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2021.3116999"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3097981"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2018.2884460"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2021.3086686"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2023.3262448"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2023.3300899"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE5003.2020.00047"},{"key":"ref13","article-title":"Open On-Chip Debugger","author":"Rath","year":"2005","journal-title":"Diploma, Department of Computer Science, University of Applied Sciences Augsburg"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1557\/jmr.2015.73"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1029\/2019JA026735"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICMLA51294.2020.00183"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2020.2983662"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1088\/1748-0221\/17\/08\/P08007"}],"event":{"name":"2025 Design, Automation & Test in Europe Conference (DATE)","location":"Lyon, France","start":{"date-parts":[[2025,3,31]]},"end":{"date-parts":[[2025,4,2]]}},"container-title":["2025 Design, Automation & Test in Europe Conference (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10992638\/10992588\/10993139.pdf?arnumber=10993139","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,22]],"date-time":"2025-05-22T06:04:48Z","timestamp":1747893888000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10993139\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3,31]]},"references-count":18,"URL":"https:\/\/doi.org\/10.23919\/date64628.2025.10993139","relation":{},"subject":[],"published":{"date-parts":[[2025,3,31]]}}}