{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,2]],"date-time":"2025-10-02T00:55:51Z","timestamp":1759366551532,"version":"build-2065373602"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T00:00:00Z","timestamp":1743379200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T00:00:00Z","timestamp":1743379200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100021171","name":"Guangdong Basic and Applied Basic Research Foundation","doi-asserted-by":"publisher","award":["23201910240002532"],"award-info":[{"award-number":["23201910240002532"]}],"id":[{"id":"10.13039\/501100021171","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,3,31]]},"DOI":"10.23919\/date64628.2025.10993142","type":"proceedings-article","created":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T13:36:35Z","timestamp":1747834595000},"page":"1-2","source":"Crossref","is-referenced-by-count":0,"title":["CIM-Based Parallel Fully FFNN Surface Code High-Level Decoder for Quantum Error Correction"],"prefix":"10.23919","author":[{"given":"Hao","family":"Wang","sequence":"first","affiliation":[{"name":"Hong Kong University of Science and Technology (Guangzhou)"}]},{"given":"Erjia","family":"Xiao","sequence":"additional","affiliation":[{"name":"Hong Kong University of Science and Technology (Guangzhou)"}]},{"given":"Songhuan","family":"He","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China"}]},{"given":"Zhongyi","family":"Ni","sequence":"additional","affiliation":[{"name":"Hong Kong University of Science and Technology (Guangzhou)"}]},{"given":"Lingfeng","family":"Zhang","sequence":"additional","affiliation":[{"name":"Hong Kong University of Science and Technology (Guangzhou)"}]},{"given":"Xiaokun","family":"Zhan","sequence":"additional","affiliation":[{"name":"Harbin Institute of Technology"}]},{"given":"Yifei","family":"Cui","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China"}]},{"given":"Jinguo","family":"Liu","sequence":"additional","affiliation":[{"name":"Hong Kong University of Science and Technology (Guangzhou)"}]},{"given":"Cheng","family":"Wang","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China"}]},{"given":"Zhongrui","family":"Wang","sequence":"additional","affiliation":[{"name":"Southern University of Science and Technology"}]},{"given":"Renjing","family":"Xu","sequence":"additional","affiliation":[{"name":"Hong Kong University of Science and Technology (Guangzhou)"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2019.2948612"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevA.86.032324"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA53966.2022.00027"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3503222.3507707"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.22331\/q-2018-01-29-48"},{"key":"ref6","article-title":"A cryogenic memristive neural decoder for fault-tolerant quantum error correction","author":"Marcotte","year":"2023","journal-title":"arXiv preprint"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.128.080505"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TQE.2022.3174017"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-022-05434-1"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DAC18074.2021.9586326"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA45697.2020.00053"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2023.3251696"}],"event":{"name":"2025 Design, Automation & Test in Europe Conference (DATE)","start":{"date-parts":[[2025,3,31]]},"location":"Lyon, France","end":{"date-parts":[[2025,4,2]]}},"container-title":["2025 Design, Automation & Test in Europe Conference (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10992638\/10992588\/10993142.pdf?arnumber=10993142","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T17:36:45Z","timestamp":1759340205000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10993142\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3,31]]},"references-count":12,"URL":"https:\/\/doi.org\/10.23919\/date64628.2025.10993142","relation":{},"subject":[],"published":{"date-parts":[[2025,3,31]]}}}