{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,23]],"date-time":"2025-05-23T04:05:05Z","timestamp":1747973105027,"version":"3.41.0"},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T00:00:00Z","timestamp":1743379200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T00:00:00Z","timestamp":1743379200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003693","name":"Korea Institute of Science and Technology","doi-asserted-by":"publisher","award":["2E33561"],"award-info":[{"award-number":["2E33561"]}],"id":[{"id":"10.13039\/501100003693","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,3,31]]},"DOI":"10.23919\/date64628.2025.10993187","type":"proceedings-article","created":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T17:36:35Z","timestamp":1747848995000},"page":"1-2","source":"Crossref","is-referenced-by-count":0,"title":["Late Breaking Results: Improving Deep SNNs with Gradient Clipping and Noise Exploitation in Neuromorphic Devices"],"prefix":"10.23919","author":[{"given":"Seongsik","family":"Park","sequence":"first","affiliation":[{"name":"Center for Semiconductor Technology, Korea Institute of Science and Technology,Seoul,Korea"}]},{"given":"Jongkil","family":"Park","sequence":"additional","affiliation":[{"name":"Center for Semiconductor Technology, Korea Institute of Science and Technology,Seoul,Korea"}]},{"given":"Hyun Jae","family":"Jang","sequence":"additional","affiliation":[{"name":"Center for Semiconductor Technology, Korea Institute of Science and Technology,Seoul,Korea"}]},{"given":"Jaewook","family":"Kim","sequence":"additional","affiliation":[{"name":"Center for Semiconductor Technology, Korea Institute of Science and Technology,Seoul,Korea"}]},{"given":"YeonJoo","family":"Jeong","sequence":"additional","affiliation":[{"name":"Center for Semiconductor Technology, Korea Institute of Science and Technology,Seoul,Korea"}]},{"given":"Gyu Weon","family":"Hwang","sequence":"additional","affiliation":[{"name":"Center for Semiconductor Technology, Korea Institute of Science and Technology,Seoul,Korea"}]},{"given":"Inho","family":"Kim","sequence":"additional","affiliation":[{"name":"Center for Semiconductor Technology, Korea Institute of Science and Technology,Seoul,Korea"}]},{"given":"Jong-Keuk","family":"Park","sequence":"additional","affiliation":[{"name":"Center for Semiconductor Technology, Korea Institute of Science and Technology,Seoul,Korea"}]},{"given":"Kyeong Seok","family":"Lee","sequence":"additional","affiliation":[{"name":"Center for Semiconductor Technology, Korea Institute of Science and Technology,Seoul,Korea"}]},{"given":"Suyoun","family":"Lee","sequence":"additional","affiliation":[{"name":"Center for Semiconductor Technology, Korea Institute of Science and Technology,Seoul,Korea"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/s43588-021-00184-y"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DAC18074.2021.9586195"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3389\/fnins.2018.00331"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v34i07.6787"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v35i12.17320"}],"event":{"name":"2025 Design, Automation & Test in Europe Conference (DATE)","start":{"date-parts":[[2025,3,31]]},"location":"Lyon, France","end":{"date-parts":[[2025,4,2]]}},"container-title":["2025 Design, Automation & Test in Europe Conference (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10992638\/10992588\/10993187.pdf?arnumber=10993187","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,22]],"date-time":"2025-05-22T05:37:35Z","timestamp":1747892255000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10993187\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3,31]]},"references-count":5,"URL":"https:\/\/doi.org\/10.23919\/date64628.2025.10993187","relation":{},"subject":[],"published":{"date-parts":[[2025,3,31]]}}}