{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,18]],"date-time":"2026-08-18T03:52:02Z","timestamp":1787025122258,"version":"3.56.0"},"reference-count":49,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T00:00:00Z","timestamp":1743379200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T00:00:00Z","timestamp":1743379200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000028","name":"Semiconductor Research Corporation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000028","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,3,31]]},"DOI":"10.23919\/date64628.2025.10993204","type":"proceedings-article","created":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T13:36:35Z","timestamp":1747834595000},"page":"1-7","source":"Crossref","is-referenced-by-count":2,"title":["Runtime Security Analysis of Monolithic 3D Embedded DRAM with Oxide-Channel Transistor"],"prefix":"10.23919","author":[{"given":"Eduardo","family":"Ortega","sequence":"first","affiliation":[{"name":"ASU Center for Semiconductor Microelectronics, Arizona State University"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jungyoun","family":"Kwak","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, Georgia Tech"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shimeng","family":"Yu","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, Georgia Tech"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Krishnendu","family":"Chakrabarty","sequence":"additional","affiliation":[{"name":"ASU Center for Semiconductor Microelectronics, Arizona State University"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/2678373.2665726"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2019.2915318"},{"key":"ref3","volume-title":"Exploiting the DRAM rowhammer bug to gain kernel privileges","year":"2023"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA45697.2020.00059"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2017.7927156"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"114116","DOI":"10.1016\/j.microrel.2021.114116","article-title":"Physical security of deep learning on edge devices: Comprehensive evaluation of fault injection attack vectors","volume":"120","author":"Hou","year":"2021","journal-title":"Microelectronics Reliability"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-16350-1_1"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-17982-3_12"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2022.3215931"},{"key":"ref10","doi-asserted-by":"crossref","first-page":"143","DOI":"10.1016\/j.microrel.2016.10.014","article-title":"Statistical distributions of row-hammering induced failures in DDR3 components","volume":"67","author":"Park","year":"2016","journal-title":"Microelectronics Reliability"},{"key":"ref11","article-title":"Rethinking ECC in the Era of Row-Hammer","author":"Qureshi","year":"2021","journal-title":"DRAMsec"},{"key":"ref12","first-page":"1","article-title":"Flip Feng Shui: hammering a needle in the software stack","volume-title":"USENIX","author":"Razavi","year":"2016"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48227.2022.9764591"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2018.00057"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/3061639.3062281"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/SP46214.2022.9833664"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/3466752.3480069"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2019.2891260"},{"key":"ref19","doi-asserted-by":"crossref","DOI":"10.1016\/j.microrel.2015.12.027","article-title":"Experiments and root cause analysis for active-precharge hammering fault in DDR3 SDRAM under 3 \u00d7 nm technology","volume-title":"Microelectron. Reliab.","author":"Park","year":"2016"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3060362"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2024.3368044"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3217212"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/3566097.3568350"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.23919\/DATE54114.2022.9774651"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.23919\/DATE56975.2023.10136903"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/INTMAG.2018.8508549"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2018.2872347"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2023.3296715"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2019.2942978"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM13553.2020.9371981"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/DSN-S58398.2023.00042"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD51958.2021.9643473"},{"key":"ref33","doi-asserted-by":"crossref","DOI":"10.1016\/j.mejo.2016.04.006","article-title":"ASAP7: A 7-nm finFET predictive process design kit","volume-title":"Microelectronics Journal","author":"Clark","year":"2016"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2012.2188839"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2015.49"},{"key":"ref36","volume-title":"Ukrainian Blackjack group used ICS malware Fuxnet against Russian targets","year":"2024"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2007.903071"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/NMDC57951.2023.10343984"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA58228.2023.10249197"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1145\/3579371.3589063"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9063030"},{"key":"ref42","volume-title":"Micron, DDR4 SDRAM","year":"2023"},{"key":"ref43","volume-title":"Analysis and design of Digital Integrated Circuits: In Deep Submicron Technology","author":"Hodges","year":"2005"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2017.8268437"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2017.8203838"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3051250"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1145\/2366231.2337202"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1145\/2678373.2665724"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/EDTM55494.2023.10103134"}],"event":{"name":"2025 Design, Automation & Test in Europe Conference (DATE)","location":"Lyon, France","start":{"date-parts":[[2025,3,31]]},"end":{"date-parts":[[2025,4,2]]}},"container-title":["2025 Design, Automation & Test in Europe Conference (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10992638\/10992588\/10993204.pdf?arnumber=10993204","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,22]],"date-time":"2025-05-22T01:48:07Z","timestamp":1747878487000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10993204\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3,31]]},"references-count":49,"URL":"https:\/\/doi.org\/10.23919\/date64628.2025.10993204","relation":{},"subject":[],"published":{"date-parts":[[2025,3,31]]}}}