{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T16:02:47Z","timestamp":1781884967375,"version":"3.54.5"},"reference-count":37,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T00:00:00Z","timestamp":1743379200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T00:00:00Z","timestamp":1743379200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,3,31]]},"DOI":"10.23919\/date64628.2025.10993281","type":"proceedings-article","created":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T17:36:35Z","timestamp":1747848995000},"page":"1-7","source":"Crossref","is-referenced-by-count":5,"title":["DEAR: Dependable 3D Architecture for Robust DNN Training"],"prefix":"10.23919","author":[{"given":"Ashish Reddy","family":"Bommana","sequence":"first","affiliation":[{"name":"School of Electrical, Computer and Energy Engineering, Arizona State University,Tempe,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Farshad","family":"Firouzi","sequence":"additional","affiliation":[{"name":"School of Electrical, Computer and Energy Engineering, Arizona State University,Tempe,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Chukwufumnanya","family":"Ogbogu","sequence":"additional","affiliation":[{"name":"School of EECS Washington State University,Pullman,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Biresh Kumar","family":"Joardar","sequence":"additional","affiliation":[{"name":"University of Houston,Department of Electrical and Computer Engineering,Houston,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Janardhan Rao","family":"Doppa","sequence":"additional","affiliation":[{"name":"School of EECS Washington State University,Pullman,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Partha Pratim","family":"Pande","sequence":"additional","affiliation":[{"name":"School of EECS Washington State University,Pullman,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Krishnendu","family":"Chakrabarty","sequence":"additional","affiliation":[{"name":"School of Electrical, Computer and Energy Engineering, Arizona State University,Tempe,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","article-title":"Very deep convolutional networks for large-scale image recognition","volume-title":"International Conference on Learning Representations","author":"Simonyan","year":"2015"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref3","article-title":"Attention is all you need","author":"Vaswani","year":"2017","journal-title":"Advances in neural information processing systems"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757323"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2016.12"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2017.55"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS45731.2020.9181020"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2855145"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3476986"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ASP-DAC47756.2020.9045730"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2022.3227871"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD46524.2019.00020"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2022.3207687"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2022.3222288"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2021.3125065"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ETS56758.2023.10174237"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JXCDC.2020.2987605"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2021.3102894"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.23919\/DATE56975.2023.10137106"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/3287624.3287707"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.23919\/DATE56975.2023.10137238"},{"key":"ref22","doi-asserted-by":"crossref","DOI":"10.1145\/3316781.3317870","article-title":"Noise injection adaption: End-to-end ReRAM crossbar non-ideal effect adaption for neural network mapping","volume-title":"Design Automation Conference","author":"He","year":"2019"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2022.3205872"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2394434"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2019.2943017"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/3240765.3240800"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310400"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM13553.2020.9371968"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.3043731"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2021.3083684"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.23919\/DATE58400.2024.10546582"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2017.7939084"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1201\/9781003138747"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2007.33"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342223"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3285896"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44170.2019.9000179"}],"event":{"name":"2025 Design, Automation & Test in Europe Conference (DATE)","location":"Lyon, France","start":{"date-parts":[[2025,3,31]]},"end":{"date-parts":[[2025,4,2]]}},"container-title":["2025 Design, Automation & Test in Europe Conference (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10992638\/10992588\/10993281.pdf?arnumber=10993281","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,22]],"date-time":"2025-05-22T05:51:54Z","timestamp":1747893114000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10993281\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3,31]]},"references-count":37,"URL":"https:\/\/doi.org\/10.23919\/date64628.2025.10993281","relation":{},"subject":[],"published":{"date-parts":[[2025,3,31]]}}}