{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,5]],"date-time":"2026-06-05T06:00:56Z","timestamp":1780639256558,"version":"3.54.1"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,4,20]],"date-time":"2026-04-20T00:00:00Z","timestamp":1776643200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,4,20]],"date-time":"2026-04-20T00:00:00Z","timestamp":1776643200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100006190","name":"Research and Development","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100006190","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,4,20]]},"DOI":"10.23919\/date69613.2026.11539128","type":"proceedings-article","created":{"date-parts":[[2026,6,4]],"date-time":"2026-06-04T19:53:10Z","timestamp":1780602790000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["TRACE: A Transferable Framework for Aging-aware Cell Delay Estimation"],"prefix":"10.23919","author":[{"given":"Muyan","family":"Jin","sequence":"first","affiliation":[{"name":"Shanghai Jiao Tong University,National Key Laboratory of Science and Technology on Micro\/Nano Fabrication,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Chao","family":"Yang","sequence":"additional","affiliation":[{"name":"T-Head Semiconductor Co., Ltd.,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yunlin","family":"Liu","sequence":"additional","affiliation":[{"name":"T-Head Semiconductor Co., Ltd.,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zejian","family":"Cai","sequence":"additional","affiliation":[{"name":"T-Head Semiconductor Co., Ltd.,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Pengpeng","family":"Ren","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University,National Key Laboratory of Science and Technology on Micro\/Nano Fabrication,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhigang","family":"Ji","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University,National Key Laboratory of Science and Technology on Micro\/Nano Fabrication,China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3106149"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ECTC51906.2022.00232"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/PVSC48317.2022.9938561"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS58634.2023.10382776"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2016.7428082"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48204.2025.10982758"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICSICT.2010.5667399"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2020.2983060"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ASP-DAC58780.2024.10473881"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISEDA62518.2024.10617843"},{"key":"ref11","first-page":"83","article-title":"Graph neural networks: A powerful and versatile tool for advancing design, reliability, and security of ics","volume-title":"Proceedings of the 28th Asia and South Pacific Design Automation Conference","author":"Alrahis"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2021.3107250"},{"key":"ref13","first-page":"898","article-title":"Analog ic aging-induced degradation estimation via heterogeneous graph convolutional networks","volume-title":"Proceedings of the 26th Asia and South Pacific Design Automation Conference","author":"Chen"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2022.3197521"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2023.3346298"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2023.3298917"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MLCAD55463.2022.9900079"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICCT46805.2019.8947072"},{"key":"ref19","first-page":"1","article-title":"Aadam: A fast, accurate, and versatile aging-aware cell library delay model using feed-forward neural network","volume-title":"Proceedings of the 39th International Conference on Computer-Aided Design","author":"Ebrahimipour"}],"event":{"name":"2026 Design, Automation & Test in Europe Conference (DATE)","location":"Verona, Italy","start":{"date-parts":[[2026,4,20]]},"end":{"date-parts":[[2026,4,22]]}},"container-title":["2026 Design, Automation & Test in Europe Conference (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11539023\/11539024\/11539128.pdf?arnumber=11539128","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,5]],"date-time":"2026-06-05T05:09:43Z","timestamp":1780636183000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11539128\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,4,20]]},"references-count":19,"URL":"https:\/\/doi.org\/10.23919\/date69613.2026.11539128","relation":{},"subject":[],"published":{"date-parts":[[2026,4,20]]}}}