{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,5]],"date-time":"2026-06-05T06:01:40Z","timestamp":1780639300403,"version":"3.54.1"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,4,20]],"date-time":"2026-04-20T00:00:00Z","timestamp":1776643200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,4,20]],"date-time":"2026-04-20T00:00:00Z","timestamp":1776643200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100007219","name":"Natural Science Foundation of Shanghai","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100007219","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,4,20]]},"DOI":"10.23919\/date69613.2026.11539384","type":"proceedings-article","created":{"date-parts":[[2026,6,4]],"date-time":"2026-06-04T19:53:10Z","timestamp":1780602790000},"page":"1-3","source":"Crossref","is-referenced-by-count":0,"title":["ARCSyn: Aging-Aware Accuracy-Reconfigurable Logic Synthesis"],"prefix":"10.23919","author":[{"given":"Ruicheng","family":"Dai","sequence":"first","affiliation":[{"name":"Shanghai Jiao Tong University,Global College,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Feiyang","family":"Shu","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University,School of Integrated Circuits,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Pengpeng","family":"Ren","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University,School of Integrated Circuits,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Runsheng","family":"Wang","sequence":"additional","affiliation":[{"name":"Peking University,School of Integrated Circuits,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Weikang","family":"Qian","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University,Global College,China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","first-page":"370","article-title":"NBTI-aware synthesis of digital circuits","volume-title":"Design Automation Conference","author":"Kumar"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2013.6691098"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2898082"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2017.8203856"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1629915"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2010.37"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2013.6569370"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2015.2505723"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2017.2672976"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICRC.2016.7738674"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/3061639.3062331"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/3386263.3406926"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3106149"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2023.3268221"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2022.3149717"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2011.6026656"},{"key":"ref17","article-title":"Liberate characterization tool"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/4.52187"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2007.4397353"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763249"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2016.04.006"}],"event":{"name":"2026 Design, Automation & Test in Europe Conference (DATE)","location":"Verona, Italy","start":{"date-parts":[[2026,4,20]]},"end":{"date-parts":[[2026,4,22]]}},"container-title":["2026 Design, Automation & Test in Europe Conference (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11539023\/11539024\/11539384.pdf?arnumber=11539384","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,5]],"date-time":"2026-06-05T05:13:05Z","timestamp":1780636385000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11539384\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,4,20]]},"references-count":21,"URL":"https:\/\/doi.org\/10.23919\/date69613.2026.11539384","relation":{},"subject":[],"published":{"date-parts":[[2026,4,20]]}}}