{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,5]],"date-time":"2026-06-05T06:01:33Z","timestamp":1780639293007,"version":"3.54.1"},"reference-count":26,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,4,20]],"date-time":"2026-04-20T00:00:00Z","timestamp":1776643200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,4,20]],"date-time":"2026-04-20T00:00:00Z","timestamp":1776643200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004608","name":"Natural Science Foundation of Jiangsu Province","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004608","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,4,20]]},"DOI":"10.23919\/date69613.2026.11539553","type":"proceedings-article","created":{"date-parts":[[2026,6,4]],"date-time":"2026-06-04T19:53:10Z","timestamp":1780602790000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["Equivalent-0ns-Replacement Self-Aware-Access LLC on Dual-Port SOT-MRAM by Sense-While-Replace"],"prefix":"10.23919","author":[{"given":"Keyang","family":"Zhang","sequence":"first","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Nanjing,China,210096"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Quanhai","family":"Zhu","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Nanjing,China,210096"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhenghan","family":"Fang","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Nanjing,China,210096"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shuyu","family":"Wang","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Nanjing,China,210096"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hao","family":"Cai","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Nanjing,China,210096"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/iedm19573.2019.8993604"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3228765"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/3287624.3287686"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TMSCS.2015.2509963"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2224256"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2391254"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM19573.2019.8993474"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2016.7417942"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2588585"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3039800"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2016.2547701"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2016.7418030"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3229828"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731754"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/LMAG.2015.2422260"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICTA64028.2024.10860292"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/VLSITechnologyandCir46769.2022.9830149"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9063072"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2015.7062963"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2020.3012669"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM50854.2024.10873510"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM50854.2024.10873500"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2024.3454609"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/EDTM61175.2025.11040575"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2185930"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/led.2025.3581530"}],"event":{"name":"2026 Design, Automation & Test in Europe Conference (DATE)","location":"Verona, Italy","start":{"date-parts":[[2026,4,20]]},"end":{"date-parts":[[2026,4,22]]}},"container-title":["2026 Design, Automation & Test in Europe Conference (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11539023\/11539024\/11539553.pdf?arnumber=11539553","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,5]],"date-time":"2026-06-05T05:12:17Z","timestamp":1780636337000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11539553\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,4,20]]},"references-count":26,"URL":"https:\/\/doi.org\/10.23919\/date69613.2026.11539553","relation":{},"subject":[],"published":{"date-parts":[[2026,4,20]]}}}