{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,5]],"date-time":"2026-06-05T06:01:51Z","timestamp":1780639311677,"version":"3.54.1"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,4,20]],"date-time":"2026-04-20T00:00:00Z","timestamp":1776643200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,4,20]],"date-time":"2026-04-20T00:00:00Z","timestamp":1776643200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100005090","name":"Beijing Nova Program","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100005090","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002358","name":"Beihang University","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002358","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,4,20]]},"DOI":"10.23919\/date69613.2026.11539632","type":"proceedings-article","created":{"date-parts":[[2026,6,4]],"date-time":"2026-06-04T19:53:10Z","timestamp":1780602790000},"page":"1-3","source":"Crossref","is-referenced-by-count":0,"title":["Noise-Aware Adaptive Sampling for Robust Diffusion Models on Analog Compute-in-Memory"],"prefix":"10.23919","author":[{"given":"Yuannuo","family":"Feng","sequence":"first","affiliation":[{"name":"Beihang University,School of Integrated Circuit Science and Engineering,Beijing,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wenyong","family":"Zhou","sequence":"additional","affiliation":[{"name":"The University of Hong Kong,Department of Electrical and Electronic Engineering,Hong Kong"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yuexi","family":"Lv","sequence":"additional","affiliation":[{"name":"Zhicun Research Lab,Beijing,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hanjie","family":"Liu","sequence":"additional","affiliation":[{"name":"Zhicun Research Lab,Beijing,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Guangyao","family":"Wang","sequence":"additional","affiliation":[{"name":"Beihang University,School of Integrated Circuit Science and Engineering,Beijing,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhengwu","family":"Liu","sequence":"additional","affiliation":[{"name":"The University of Hong Kong,Department of Electrical and Electronic Engineering,Hong Kong"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ngai","family":"Wong","sequence":"additional","affiliation":[{"name":"The University of Hong Kong,Department of Electrical and Electronic Engineering,Hong Kong"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wang","family":"Kang","sequence":"additional","affiliation":[{"name":"Beihang University,School of Integrated Circuit Science and Engineering,Beijing,China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","first-page":"6840","article-title":"Denoising diffusion probabilistic models","volume":"33","author":"Ho","year":"2020","journal-title":"Advances in neural information processing systems"},{"key":"ref2","article-title":"Denoising Diffusion Implicit Models","volume-title":"International Conference on Learning Representations","author":"Song"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV51070.2023.01608"},{"key":"ref4","article-title":"Pseudo numerical methods for diffusion models on manifolds","volume-title":"International Conference on Learning Representations","author":"Liu"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.34133\/research.0413"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.34133\/research.1029"},{"key":"ref7","first-page":"1","article-title":"Computing-in-memory neural network accelerators for safety-critical systems: Can small device variations be disastrous?","volume-title":"2022 IEEE\/ACM International Conference On Computer Aided Design (ICCAD)","author":"Yan"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2025.3626453"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3801559"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/asicon66040.2025.11325922"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/asicon66040.2025.11325994"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICME59968.2025.11210085"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/EDTM61175.2025.11040595"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2025.3595830"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.23919\/DATE64628.2025.10993259"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342276"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.23919\/DATE64628.2025.10993112"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP49660.2025.10889294"}],"event":{"name":"2026 Design, Automation & Test in Europe Conference (DATE)","location":"Verona, Italy","start":{"date-parts":[[2026,4,20]]},"end":{"date-parts":[[2026,4,22]]}},"container-title":["2026 Design, Automation & Test in Europe Conference (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11539023\/11539024\/11539632.pdf?arnumber=11539632","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,5]],"date-time":"2026-06-05T05:13:51Z","timestamp":1780636431000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11539632\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,4,20]]},"references-count":18,"URL":"https:\/\/doi.org\/10.23919\/date69613.2026.11539632","relation":{},"subject":[],"published":{"date-parts":[[2026,4,20]]}}}