{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T00:09:12Z","timestamp":1725667752409},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,1]]},"DOI":"10.23919\/elinfocom.2019.8706449","type":"proceedings-article","created":{"date-parts":[[2019,5,20]],"date-time":"2019-05-20T22:44:21Z","timestamp":1558392261000},"page":"1-4","source":"Crossref","is-referenced-by-count":2,"title":["2-stage ESD protection circuit with high holding voltage and low trigger voltage for high voltage applications"],"prefix":"10.23919","author":[{"given":"Byung-Seok","family":"Lee","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hee-Guk","family":"Chae","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yong-Seo","family":"Koo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kyeong-Il","family":"Do","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jin-Woo","family":"Eo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2009.01.001"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-74514-5"},{"key":"ref6","first-page":"77","article-title":"ESD protection for high-voltage CMOS technologies","author":"quittard","year":"2006","journal-title":"EOS\/ESD Symp"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.7471\/ikeee.2016.20.3.295"},{"journal-title":"A Study on the Novel SCR Nano ESD Protection Device Design and Fabrication","year":"0","author":"kim","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2005451"},{"journal-title":"On-Chip ESD Protection for Integrated devices","year":"2002","author":"albert","key":"ref1"}],"event":{"name":"2019 International Conference on Electronics, Information, and Communication (ICEIC)","start":{"date-parts":[[2019,1,22]]},"location":"Auckland, New Zealand","end":{"date-parts":[[2019,1,25]]}},"container-title":["2019 International Conference on Electronics, Information, and Communication (ICEIC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8698536\/8706336\/08706449.pdf?arnumber=8706449","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,24]],"date-time":"2020-08-24T01:17:22Z","timestamp":1598231842000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8706449\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,1]]},"references-count":7,"URL":"https:\/\/doi.org\/10.23919\/elinfocom.2019.8706449","relation":{},"subject":[],"published":{"date-parts":[[2019,1]]}}}