{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,31]],"date-time":"2024-10-31T03:00:02Z","timestamp":1730343602534,"version":"3.28.0"},"reference-count":27,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,2]]},"DOI":"10.23919\/icact.2018.8323652","type":"proceedings-article","created":{"date-parts":[[2018,4,11]],"date-time":"2018-04-11T21:11:35Z","timestamp":1523481095000},"page":"78-84","source":"Crossref","is-referenced-by-count":0,"title":["A productivity improvement of distributed software testing using checkpoint"],"prefix":"10.23919","author":[{"given":"Bhuridech","family":"Sudsee","sequence":"first","affiliation":[]},{"given":"Chanwit Kaewkasi","family":"Kaewkasi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"JUnit 5","year":"0","key":"ref10"},{"journal-title":"holdenk\/spark-testing-base","year":"0","key":"ref11"},{"journal-title":"[SPARK-2243] Support multiple SparkContexts in the same JVM-ASF JIRA","year":"0","key":"ref12"},{"journal-title":"Test-Driven Development By Example","year":"2003","author":"beck","key":"ref13"},{"journal-title":"Learning Spark Lightning-Fast Big Data Analysis","year":"2015","author":"karau","key":"ref14"},{"journal-title":"JerryLead\/SparkInternals","year":"0","key":"ref15"},{"journal-title":"High Performance Spark Best Practices for Scaling and Optimizing Apache Spark","year":"2017","author":"karau","key":"ref16"},{"key":"ref17","article-title":"Using the ASM framework to implement common Java bytecode transformation patterns","author":"kuleshov","year":"2007","journal-title":"Aspect-Oriented Software Development"},{"key":"ref18","first-page":"2","article-title":"Resilient distributed datasets: A fault-tolerant abstraction for in-memory cluster computing","author":"zaharia","year":"2012","journal-title":"Proceedings of the 9th USENIX Conference on Networked Systems Design and Implementation"},{"journal-title":"A Universally Unique IDentifier (UUID) URN Namespace","year":"0","key":"ref19"},{"journal-title":"Welcome to Apache Hadoop","year":"0","key":"ref4"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/2987550.2987576"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"551","DOI":"10.1002\/(SICI)1097-024X(199905)29:6<551::AID-SPE248>3.0.CO;2-C","article-title":"Cluster Computing: The Commodity Supercomputer","volume":"29","author":"mark","year":"1999","journal-title":"Software-Practice and Experience"},{"key":"ref6","first-page":"10","article-title":"Spark: Cluster Computing with Working Sets","author":"zaharia","year":"2010","journal-title":"Proceedings of the 2nd USENIX Conference on Hot Topics in Cloud Computing"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1247480.1247602"},{"journal-title":"Software Testing Foundation A Study Guide for the Certified Tester Exam","year":"2014","author":"spillner","key":"ref8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2950290.2983930"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/1327452.1327492"},{"journal-title":"Scalatest","year":"0","key":"ref9"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/2481244.2481246"},{"journal-title":"Getting Started with SBT for Scala","year":"2013","author":"saxena","key":"ref20"},{"journal-title":"sbt\/sbt-assembly","year":"0","key":"ref22"},{"journal-title":"Home | Apache Ivy TM","year":"0","key":"ref21"},{"journal-title":"bloomberg\/spark-flow","year":"0","key":"ref24"},{"journal-title":"The Daily Build-write simple SBT task","year":"0","key":"ref23"},{"key":"ref26","first-page":"6","article-title":"Flint: batch-interactive data-intensive processing on transient servers","author":"sharma","year":"2016","journal-title":"Proceedings of the Eleventh European Conference on Computer Systems"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICACT.2016.7423490"}],"event":{"name":"2018 20th International Conference on Advanced Communications Technology (ICACT)","start":{"date-parts":[[2018,2,11]]},"location":"Chuncheon-si Gangwon-do, Korea (South)","end":{"date-parts":[[2018,2,14]]}},"container-title":["2018 20th International Conference on Advanced Communication Technology (ICACT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8318543\/8323471\/08323652.pdf?arnumber=8323652","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,24]],"date-time":"2020-08-24T00:58:47Z","timestamp":1598230727000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8323652\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,2]]},"references-count":27,"URL":"https:\/\/doi.org\/10.23919\/icact.2018.8323652","relation":{},"subject":[],"published":{"date-parts":[[2018,2]]}}}