{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,12]],"date-time":"2026-04-12T02:43:48Z","timestamp":1775961828861,"version":"3.50.1"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.23919\/mipro.2017.7973559","type":"proceedings-article","created":{"date-parts":[[2017,7,25]],"date-time":"2017-07-25T19:28:35Z","timestamp":1501010915000},"page":"944-948","source":"Crossref","is-referenced-by-count":1,"title":["Theoretical and practical challenges of using three ammeter or tree voltmeter methods in teaching"],"prefix":"10.23919","author":[{"given":"Vladimir","family":"Simovic","sequence":"first","affiliation":[]},{"given":"Trpimir","family":"Alajbeg","sequence":"additional","affiliation":[]},{"given":"Josip","family":"Curkovic","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"19","article-title":"Analysis of a three-voltmeter measurement method designed for low-frequency impedance comparisons","volume":"13","author":"muciek","year":"2006","journal-title":"Metrology and Measurement Systems"},{"key":"ref3","article-title":"New Trend in Laboratory Sessions","author":"and\u00f2","year":"0"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MIPRO.2015.7160409"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MIPRO.2014.6859645"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.815990"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1972.4314042"},{"key":"ref2","article-title":"Web-Based Laboratory Training on Electrical Measurement Systems","author":"baumgartner","year":"2003","journal-title":"XVII IMEKO World Congress 2003"},{"key":"ref9","first-page":"19","article-title":"Analysis of a three-voltmeter measurement method designed for low-frequency impedance comparisons","volume":"13","author":"muciek","year":"2006","journal-title":"Metrology and Measurement System"},{"key":"ref1","first-page":"93","article-title":"Volt-Ammeter Method introducing Principles and developing Technologies to undergraduates","author":"and\u00f2","year":"0"}],"event":{"name":"2017 40th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO)","location":"Opatija, Croatia","start":{"date-parts":[[2017,5,22]]},"end":{"date-parts":[[2017,5,26]]}},"container-title":["2017 40th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7958418\/7973374\/07973559.pdf?arnumber=7973559","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,8,16]],"date-time":"2017-08-16T16:12:46Z","timestamp":1502899966000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7973559\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":9,"URL":"https:\/\/doi.org\/10.23919\/mipro.2017.7973559","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}