{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,31]],"date-time":"2024-10-31T03:15:37Z","timestamp":1730344537186,"version":"3.28.0"},"reference-count":27,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,9,28]]},"DOI":"10.23919\/mipro48935.2020.9245294","type":"proceedings-article","created":{"date-parts":[[2020,11,6]],"date-time":"2020-11-06T21:51:34Z","timestamp":1604699494000},"page":"1103-1108","source":"Crossref","is-referenced-by-count":1,"title":["Synthetic astronomical image sequence generation"],"prefix":"10.23919","author":[{"given":"Anita","family":"Gribl","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Davor","family":"Petrinovic","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2015.2463084"},{"key":"ref11","article-title":"Dynamic non-regular sampling sensor using frequency selective reconstruction","author":"jonscher","year":"2018","journal-title":"IEEE Transactions on Circuits and Systems for Video Technology"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-015-0817-x"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1201\/9781420007299"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1364\/OE.21.018820"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2005.860336"},{"key":"ref16","first-page":"4","author":"wilcox","year":"1999","journal-title":"How to Measure MTF and Other Properties of Lenses"},{"key":"ref17","article-title":"How to read mtf curves","author":"nasse","year":"2008","journal-title":"Carl Zeiss camera lens division report"},{"key":"ref18","first-page":"75","article-title":"On the rendering of synthetic images with specific point spread functions","author":"van den bergh","year":"2012","journal-title":"Twenty-Third Annual Symposium of the Pattern Recognition Association of South Africa"},{"key":"ref19","first-page":"27","article-title":"Modeling and measurement of image sensor characteristics","volume":"13","author":"fliegel","year":"2004","journal-title":"RADIOENGINEERING -PRAGUE"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1051\/aas:2000169"},{"journal-title":"Digital Microscopy","year":"2013","author":"sluder","key":"ref27"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2007.4286571"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"21","DOI":"10.1109\/MSP.2003.1203207","article-title":"Super-resolution image reconstruction: a technical overview","volume":"20","author":"park","year":"2003","journal-title":"IEEE Signal Processing Magazine"},{"key":"ref5","first-page":"20","article-title":"Image super-resolution: Historical overview and future challenges","author":"yang","year":"2010","journal-title":"Super-Resolution Imaging"},{"key":"ref8","first-page":"21","article-title":"An introduction to compressive sampling [a sensing\/sampling paradigm that goes against the common knowledge in data acquisition]","volume":"25","author":"cand\u00e8s","year":"2008","journal-title":"IEEE Signal Processing Magazine"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s11760-010-0204-6"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1155\/2015\/469859"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2011.6115839"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s00138-014-0623-4"},{"key":"ref20","article-title":"Modulation transfer function in optical and electrooptical systems","volume":"4","author":"boreman","year":"2001","journal-title":"Bellingham WA SPIE Press"},{"journal-title":"Introduction to Fourier Optics","year":"2005","author":"goodman","key":"ref22"},{"journal-title":"A SIMPLE MODEL FOR SHARPNESS IN DIGITAL CAMERAS – AA","year":"2016","key":"ref21"},{"key":"ref24","article-title":"Decentering distortion of lenses","author":"brown","year":"1966","journal-title":"Photogrammetric Engineering and Remote Sensing"},{"key":"ref23","first-page":"28","article-title":"Basic wavefront aberration theory for optical metrology","volume":"11","author":"wyant","year":"1992","journal-title":"Applied Optics and Optical Engineering"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-31439-6_482"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.3390\/s16060807"}],"event":{"name":"2020 43rd International Convention on Information, Communication and Electronic Technology (MIPRO)","start":{"date-parts":[[2020,9,28]]},"location":"Opatija, Croatia","end":{"date-parts":[[2020,10,2]]}},"container-title":["2020 43rd International Convention on Information, Communication and Electronic Technology (MIPRO)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9245088\/9245075\/09245294.pdf?arnumber=9245294","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,12,18]],"date-time":"2020-12-18T21:34:35Z","timestamp":1608327275000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9245294\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,9,28]]},"references-count":27,"URL":"https:\/\/doi.org\/10.23919\/mipro48935.2020.9245294","relation":{},"subject":[],"published":{"date-parts":[[2020,9,28]]}}}