{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T15:18:14Z","timestamp":1725722294526},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T00:00:00Z","timestamp":1684713600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T00:00:00Z","timestamp":1684713600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,5,22]]},"DOI":"10.23919\/mipro57284.2023.10159949","type":"proceedings-article","created":{"date-parts":[[2023,6,29]],"date-time":"2023-06-29T17:20:56Z","timestamp":1688059256000},"page":"202-207","source":"Crossref","is-referenced-by-count":0,"title":["Measurement System for Characterization of a Resistor Array in 180-nm CMOS Technology"],"prefix":"10.23919","author":[{"given":"Ivana","family":"Frankovi\u0107","sequence":"first","affiliation":[{"name":"University of Zagreb,Faculty of Electrical Engineering and Computing,Zagreb,Croatia"}]},{"given":"Franjo","family":"Miki\u0107","sequence":"additional","affiliation":[{"name":"University of Zagreb,Faculty of Electrical Engineering and Computing,Zagreb,Croatia"}]},{"given":"Josip","family":"Mikuli\u0107","sequence":"additional","affiliation":[{"name":"ams-OSRAM AG,Premstaetten"}]},{"given":"Niko","family":"Bako","sequence":"additional","affiliation":[{"name":"ams-OSRAM AG,Premstaetten"}]},{"given":"Gregor","family":"Schatzberger","sequence":"additional","affiliation":[{"name":"ams-OSRAM AG,Premstaetten"}]},{"given":"Adrijan","family":"Bari\u0107","sequence":"additional","affiliation":[{"name":"University of Zagreb,Faculty of Electrical Engineering and Computing,Zagreb,Croatia"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/LASCAS.2019.8667567"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICEIE.2010.5559872"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2008.2003087"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/EMEIT.2011.6023563"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1998.746470"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2003.811583"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2008.4509307"},{"key":"ref8","first-page":"99","article-title":"Modelling of Silicided and Blocked Poly-Si Resistors in 90 nm CMOS with the CMC-R2 Model","volume-title":"Proceedings of the 18th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2011","author":"Landgraf"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.813472"},{"volume-title":"CMOS Circuit Design, Layout, and Simulation","year":"2019","author":"Baker","key":"ref10"}],"event":{"name":"2023 46th MIPRO ICT and Electronics Convention (MIPRO)","start":{"date-parts":[[2023,5,22]]},"location":"Opatija, Croatia","end":{"date-parts":[[2023,5,26]]}},"container-title":["2023 46th MIPRO ICT and Electronics Convention (MIPRO)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10159631\/10159632\/10159949.pdf?arnumber=10159949","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T11:33:16Z","timestamp":1709292796000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10159949\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5,22]]},"references-count":10,"URL":"https:\/\/doi.org\/10.23919\/mipro57284.2023.10159949","relation":{},"subject":[],"published":{"date-parts":[[2023,5,22]]}}}