{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T01:23:58Z","timestamp":1725413038482},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,6]]},"DOI":"10.23919\/mixdes.2018.8436642","type":"proceedings-article","created":{"date-parts":[[2018,8,17]],"date-time":"2018-08-17T20:14:20Z","timestamp":1534536860000},"page":"198-203","source":"Crossref","is-referenced-by-count":0,"title":["Topology-Driven Reliability Assessment of Integrated Circuits"],"prefix":"10.23919","author":[{"given":"Theodor","family":"Hillebrand","sequence":"first","affiliation":[]},{"given":"Steffen","family":"Paul","sequence":"additional","affiliation":[]},{"given":"Dagmar Peters-","family":"Drolshagen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4020-8573-4","author":"stefanovic","year":"2008","journal-title":"Structured Analog CMOS Design"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6860672"},{"journal-title":"The gm\/ID Methodology a sizing tool for low-voltage analog CMOS Circuits The semi-empirical and compact model approaches","year":"2009","author":"jespers","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-6163-0"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-08994-2"},{"journal-title":"Bias Temperature Instability for Devices and Circuits","year":"2013","author":"grasser","key":"ref1"}],"event":{"name":"2018 25th International Conference \"Mixed Design of Integrated Circuits and System\" (MIXDES)","start":{"date-parts":[[2018,6,21]]},"location":"Gdynia, Poland","end":{"date-parts":[[2018,6,23]]}},"container-title":["2018 25th International Conference \"Mixed Design of Integrated Circuits and System\" (MIXDES)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8422065\/8436585\/08436642.pdf?arnumber=8436642","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,23]],"date-time":"2020-08-23T22:18:02Z","timestamp":1598221082000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8436642\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,6]]},"references-count":6,"URL":"https:\/\/doi.org\/10.23919\/mixdes.2018.8436642","relation":{},"subject":[],"published":{"date-parts":[[2018,6]]}}}