{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,30]],"date-time":"2026-04-30T16:26:50Z","timestamp":1777566410573,"version":"3.51.4"},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,6]]},"DOI":"10.23919\/mixdes.2018.8436726","type":"proceedings-article","created":{"date-parts":[[2018,8,17]],"date-time":"2018-08-17T16:14:20Z","timestamp":1534522460000},"page":"34-38","source":"Crossref","is-referenced-by-count":5,"title":["Qualification of Electronic Systems for Radiation Environments of High Energy Accelerator"],"prefix":"10.23919","author":[{"given":"Slawosz","family":"Uznanski","sequence":"first","affiliation":[]},{"given":"Ruben Garcia","family":"Alia","sequence":"additional","affiliation":[]},{"given":"Markus","family":"Brugger","sequence":"additional","affiliation":[]},{"given":"Chiara","family":"Cangialosi","sequence":"additional","affiliation":[]},{"given":"Salvatore","family":"Danzeca","sequence":"additional","affiliation":[]},{"given":"Benjamin","family":"Todd","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2012.2183677"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2368150"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2356641"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2253800"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2365046"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2368149"},{"key":"ref16","article-title":"Radiation Characterization of Microsemi ProASIC3 Flash FPGA Family","author":"poivey","year":"2011","journal-title":"Proc IEEE REDW 2011"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2017.2776107"},{"key":"ref4","article-title":"Electronic Radiation Hardening-Radiation Hardness Assurance and Technology Demonstration Activities","author":"ferlet-cavrois","year":"2011","journal-title":"Proc JUICE Instrum Workshop"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/23.736521"},{"key":"ref6","article-title":"Caractérisation efficiente des systèmes COTS aux environnements radiatifs spatiaux","author":"bibikoff","year":"0","journal-title":"RADSOL"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2302432"},{"key":"ref8","article-title":"SEL Hardness Assurance in a Mixed Radiation Field","volume":"62","author":"garc\u00eda alia","year":"2015","journal-title":"IEEE Trans Nucl Sci"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2011.2168978"},{"key":"ref2","article-title":"Radiation Hardness Assurance (RHA) for Space Systems","author":"poivey","year":"0","journal-title":"EPFL Space Center"},{"key":"ref1","article-title":"Radiation Hardness Assurance fo Space Systems","author":"poivey","year":"0","journal-title":"Proc 2002 IEEE NSREC Conf Short Course"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2016.2528289"}],"event":{"name":"2018 25th International Conference \"Mixed Design of Integrated Circuits and System\" (MIXDES)","location":"Gdynia, Poland","start":{"date-parts":[[2018,6,21]]},"end":{"date-parts":[[2018,6,23]]}},"container-title":["2018 25th International Conference \"Mixed Design of Integrated Circuits and System\" (MIXDES)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8422065\/8436585\/08436726.pdf?arnumber=8436726","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,23]],"date-time":"2020-08-23T21:13:25Z","timestamp":1598217205000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8436726\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,6]]},"references-count":17,"URL":"https:\/\/doi.org\/10.23919\/mixdes.2018.8436726","relation":{},"subject":[],"published":{"date-parts":[[2018,6]]}}}