{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,31]],"date-time":"2024-10-31T03:13:13Z","timestamp":1730344393020,"version":"3.28.0"},"reference-count":23,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,6]]},"DOI":"10.23919\/mixdes.2018.8436929","type":"proceedings-article","created":{"date-parts":[[2018,8,17]],"date-time":"2018-08-17T20:14:20Z","timestamp":1534536860000},"page":"85-88","source":"Crossref","is-referenced-by-count":0,"title":["Integration and Testing of Large Scale Diagnostic Systems"],"prefix":"10.23919","author":[{"given":"Pawel","family":"Plewinski","sequence":"first","affiliation":[]},{"given":"Dariusz","family":"Makowski","sequence":"additional","affiliation":[]},{"given":"Piotr","family":"Perek","sequence":"additional","affiliation":[]},{"given":"Andrzej","family":"Napieralski","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","article-title":"Scientific Computing for Real Time Data Processing and Archiving for ITER Operation","author":"simrock","year":"2012","journal-title":"International Atomic Energy Agency"},{"key":"ref11","article-title":"Diagnostic Use Case Examples for ITER Plant Instrumentation and Control","author":"simrock","year":"2013","journal-title":"ICALEPCS"},{"journal-title":"The Art of Software Testing","year":"2004","author":"myers","key":"ref12"},{"key":"ref13","article-title":"Procedure for Inspection and Testing","author":"alessandro","year":"2017","journal-title":"ITER internal document (TVL3Y5) v1 2"},{"key":"ref14","article-title":"System Test Plan including new operational procedures for DNFM use case","author":"perek","year":"2018","journal-title":"ITER internal document (T8D47U) v1 5"},{"key":"ref15","article-title":"Integration of ITER Diagnostic Systems with CODAC","author":"simrock","year":"2010","journal-title":"ITER internal document (3LTQ6N) v1 4"},{"key":"ref16","article-title":"IO (CODAC) requirements for I&C integration","author":"tania","year":"2011","journal-title":"ITER internal document (6P76×6) v2 2"},{"key":"ref17","article-title":"Plant control design handbook.","author":"journeaux","year":"2013","journal-title":"ITER Int Org"},{"journal-title":"Overview of the Experimental Physics and Industrial Control System EPICS","year":"2000","author":"lewis","key":"ref18"},{"key":"ref19","article-title":"Guidelines for PSOS SM management by COS SM","author":"journeaux","year":"2013","journal-title":"ITER internal document (32GEBH) v2 5"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.fusengdes.2018.02.072"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.fusengdes.2015.06.093"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2016.2553125"},{"key":"ref5","article-title":"Plant System I&C Architecture","volume":"v2 5","author":"wallander","year":"2014","journal-title":"ITER internal document (32GEBH)"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/1748-0221\/7\/04\/C04012"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.13182\/FST16-108"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2017.2684243"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.fusengdes.2016.04.017"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2016.2517402"},{"journal-title":"Python Testing Cookbook","year":"2011","author":"turnquist","key":"ref20"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ASEW.2015.19"},{"key":"ref21","article-title":"Control System Studio (CSS).","author":"hatje","year":"2007","journal-title":"ICALEPCS"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2013.6698881"}],"event":{"name":"2018 25th International Conference \"Mixed Design of Integrated Circuits and System\" (MIXDES)","start":{"date-parts":[[2018,6,21]]},"location":"Gdynia","end":{"date-parts":[[2018,6,23]]}},"container-title":["2018 25th International Conference \"Mixed Design of Integrated Circuits and System\" (MIXDES)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8422065\/8436585\/08436929.pdf?arnumber=8436929","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,23]],"date-time":"2020-08-23T22:18:09Z","timestamp":1598221089000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8436929\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,6]]},"references-count":23,"URL":"https:\/\/doi.org\/10.23919\/mixdes.2018.8436929","relation":{},"subject":[],"published":{"date-parts":[[2018,6]]}}}