{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T20:36:27Z","timestamp":1725482187923},"reference-count":29,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,6]]},"DOI":"10.23919\/mixdes.2019.8787131","type":"proceedings-article","created":{"date-parts":[[2019,8,5]],"date-time":"2019-08-05T21:07:03Z","timestamp":1565039223000},"page":"356-361","source":"Crossref","is-referenced-by-count":0,"title":["High-Level Functional Test Generation for Microprocessor Modules"],"prefix":"10.23919","author":[{"given":"Adeboye Stephen","family":"Oyeniran","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Raimund","family":"Ubar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2012.2208130"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2008.15"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2036184"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2006.186"},{"key":"ref14","article-title":"Native mode functional test generation for processors with applications to self test and design validation","author":"shen","year":"1998","journal-title":"Int Test Conference"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041810"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297675"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.1277902"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2013.6562677"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2356612"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/PGEC.1966.264376"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2003.1219068"},{"journal-title":"MiniMIPS ISA","year":"0","key":"ref27"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297676"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2007.896908"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2012.2208130"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/43.913755"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2005.68"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2006.186"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2006.186"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2007.893650"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2007.896908"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2010.166"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2000866"},{"key":"ref21","article-title":"On the functional test of the cache coherency logic in multi-core systems","author":"perez acle","year":"2015","journal-title":"LATS"},{"key":"ref24","first-page":"299","article-title":"On the in-field functional testing of decode units in pipelined rise processors","author":"bernardi","year":"2014","journal-title":"IEEE Int Symp on Defect and Fault Tolerance in VLSI and Nanotechnology Systems"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/MTV.2013.10"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2014.6841923"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.3176\/eng.2010.1.06"}],"event":{"name":"2019 MIXDES - 26th International Conference \"Mixed Design of Integrated Circuits and Systems\"","start":{"date-parts":[[2019,6,27]]},"location":"Rzesz\u00f3w, Poland","end":{"date-parts":[[2019,6,29]]}},"container-title":["2019 MIXDES - 26th International Conference \"Mixed Design of Integrated Circuits and Systems\""],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8777447\/8786996\/08787131.pdf?arnumber=8787131","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,2]],"date-time":"2019-09-02T21:25:16Z","timestamp":1567459516000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8787131\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6]]},"references-count":29,"URL":"https:\/\/doi.org\/10.23919\/mixdes.2019.8787131","relation":{},"subject":[],"published":{"date-parts":[[2019,6]]}}}