{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,9]],"date-time":"2026-04-09T14:41:28Z","timestamp":1775745688597,"version":"3.50.1"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,6,24]]},"DOI":"10.23919\/mixdes52406.2021.9497643","type":"proceedings-article","created":{"date-parts":[[2021,7,30]],"date-time":"2021-07-30T21:06:30Z","timestamp":1627679190000},"page":"14-19","source":"Crossref","is-referenced-by-count":3,"title":["Modeling and Simulation of Charge Trapping in 1\/f Noise, RTN and BTI: from Devices to Circuits"],"prefix":"10.23919","author":[{"given":"Gilson","family":"Wirth","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.29292\/jics.v12i2.452"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1999.823869"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2005.850955"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2593916"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3028747"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2013.6724730"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2010.5703295"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2011.03.065"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2687762"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2012.6479104"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3039204"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4020-5910-0"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.23919\/MIXDES.2017.8005169"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2878841"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.888672"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2020.3015842"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-7909-3"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-37500-3"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.29292\/jics.v8i2.375"}],"event":{"name":"2021 28th International Conference on Mixed Design of Integrated Circuits and System (MIXDES)","location":"Lodz, Poland","start":{"date-parts":[[2021,6,24]]},"end":{"date-parts":[[2021,6,26]]}},"container-title":["2021 28th International Conference on Mixed Design of Integrated Circuits and System"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9497503\/9497504\/09497643.pdf?arnumber=9497643","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,1]],"date-time":"2021-11-01T20:55:01Z","timestamp":1635800101000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9497643\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,6,24]]},"references-count":19,"URL":"https:\/\/doi.org\/10.23919\/mixdes52406.2021.9497643","relation":{},"subject":[],"published":{"date-parts":[[2021,6,24]]}}}