{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T11:04:00Z","timestamp":1762254240006},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,7,3]],"date-time":"2022-07-03T00:00:00Z","timestamp":1656806400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,7,3]],"date-time":"2022-07-03T00:00:00Z","timestamp":1656806400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,7,3]]},"DOI":"10.23919\/oecc\/psc53152.2022.9850233","type":"proceedings-article","created":{"date-parts":[[2022,8,17]],"date-time":"2022-08-17T15:42:15Z","timestamp":1660750935000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Measurement Accuracy Evaluation of High-Speed BOCDR with Wide Strain Dynamic Range"],"prefix":"10.23919","author":[{"given":"Kohei","family":"Noda","sequence":"first","affiliation":[{"name":"Institute of Innovative Research, Tokyo Institute of Technology,Yokohama,Japan,226-8503"}]},{"given":"Heeyoung","family":"Lee","sequence":"additional","affiliation":[{"name":"College of Engineering, Shibaura Institute of Technology,Tokyo,Japan,135-8548"}]},{"given":"Kentaro","family":"Nakamura","sequence":"additional","affiliation":[{"name":"Institute of Innovative Research, Tokyo Institute of Technology,Yokohama,Japan,226-8503"}]},{"given":"Yosuke","family":"Mizuno","sequence":"additional","affiliation":[{"name":"Yokohama National University,Faculty of Engineering,Yokohama,Japan,240-8501"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s10043-020-00624-6"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1364\/OE.24.029190"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s10043-018-0436-1"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/lsa.2016.184"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3153169"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/13\/11\/311"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1364\/OE.16.012148"}],"event":{"name":"2022 27th OptoElectronics and Communications Conference (OECC) and 2022 International Conference on Photonics in Switching and Computing (PSC)","start":{"date-parts":[[2022,7,3]]},"location":"Toyama, Japan","end":{"date-parts":[[2022,7,6]]}},"container-title":["2022 27th OptoElectronics and Communications Conference (OECC) and 2022 International Conference on Photonics in Switching and Computing (PSC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9849706\/9849712\/09850233.pdf?arnumber=9850233","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,9,12]],"date-time":"2022-09-12T15:58:40Z","timestamp":1662998320000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9850233\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,7,3]]},"references-count":7,"URL":"https:\/\/doi.org\/10.23919\/oecc\/psc53152.2022.9850233","relation":{},"subject":[],"published":{"date-parts":[[2022,7,3]]}}}