{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,20]],"date-time":"2025-11-20T13:00:52Z","timestamp":1763643652502,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,9,6]],"date-time":"2022-09-06T00:00:00Z","timestamp":1662422400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,9,6]],"date-time":"2022-09-06T00:00:00Z","timestamp":1662422400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,9,6]]},"DOI":"10.23919\/sice56594.2022.9905797","type":"proceedings-article","created":{"date-parts":[[2022,10,6]],"date-time":"2022-10-06T19:43:18Z","timestamp":1665085398000},"page":"542-547","source":"Crossref","is-referenced-by-count":5,"title":["Remaining Useful Life Estimation with End-to-end Learning from Long Run-to-failure Data"],"prefix":"10.23919","author":[{"given":"Masanao","family":"Natsumeda","sequence":"first","affiliation":[{"name":"NEC Corporation,Digital Technology Development Laboratories,Kanagawa,Japan"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2019.02.004"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICPHM.2019.8819420"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/PHM.2008.4711422"},{"key":"ref13","first-page":"2127","article-title":"Attention-based deep multiple instance learning","volume":"80","author":"ilse","year":"2018","journal-title":"Proceedings of the 35th International Conference on Machine Learning"},{"key":"ref14","article-title":"Turbofan engine degradation simulation data set","author":"saxena","year":"2008","journal-title":"NASA Ames Prognostics Data Repository"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICPHM.2019.8819400"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICPHM.2019.8819384"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-32025-0_14"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2012.2209131"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICPHM49022.2020.9187025"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-021-01750-x"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.renene.2017.05.020"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICPHM.2017.7998311"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2016.2582798"}],"event":{"name":"2022 61st Annual Conference of the Society of Instrument and Control Engineers (SICE)","start":{"date-parts":[[2022,9,6]]},"location":"Kumamoto, Japan","end":{"date-parts":[[2022,9,9]]}},"container-title":["2022 61st Annual Conference of the Society of Instrument and Control Engineers (SICE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9905734\/9905735\/09905797.pdf?arnumber=9905797","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,11,28]],"date-time":"2022-11-28T20:24:40Z","timestamp":1669667080000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9905797\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9,6]]},"references-count":14,"URL":"https:\/\/doi.org\/10.23919\/sice56594.2022.9905797","relation":{},"subject":[],"published":{"date-parts":[[2022,9,6]]}}}