{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,5]],"date-time":"2025-11-05T06:50:36Z","timestamp":1762325436646},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,9,6]],"date-time":"2022-09-06T00:00:00Z","timestamp":1662422400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,9,6]],"date-time":"2022-09-06T00:00:00Z","timestamp":1662422400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,9,6]]},"DOI":"10.23919\/sice56594.2022.9905863","type":"proceedings-article","created":{"date-parts":[[2022,10,6]],"date-time":"2022-10-06T15:43:18Z","timestamp":1665070998000},"page":"548-552","source":"Crossref","is-referenced-by-count":1,"title":["Feature selection for quality prediction under distribution shift"],"prefix":"10.23919","author":[{"given":"Wenyi","family":"Liu","sequence":"first","affiliation":[{"name":"The University of Tokyo,Department of Advanced Interdisciplinary Studies,Tokyo,Japan"}]},{"given":"Takehisa","family":"Yairi","sequence":"additional","affiliation":[{"name":"The University of Tokyo,Department of Advanced Interdisciplinary Studies,Tokyo,Japan"}]},{"given":"Nana","family":"Tamai","sequence":"additional","affiliation":[{"name":"Central Technical Research Laboratory, ENEOS,Data Science Group,Innovation Technology Center,Yokohama,Japan"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1016\/j.compeleceng.2013.11.024"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1016\/j.compchemeng.2008.12.012"},{"key":"ref6","first-page":"296","article-title":"An adaptation of Relief for attribute estimation in regression","author":"robnik-\u0161ikonja","year":"1997","journal-title":"Proceedings of the 14th International Conference on Machine Learning"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1016\/B978-1-55860-247-2.50037-1"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/TAC.1974.1100705"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1016\/S0959-1524(00)00046-9"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1016\/j.compchemeng.2006.05.030"}],"event":{"name":"2022 61st Annual Conference of the Society of Instrument and Control Engineers (SICE)","start":{"date-parts":[[2022,9,6]]},"location":"Kumamoto, Japan","end":{"date-parts":[[2022,9,9]]}},"container-title":["2022 61st Annual Conference of the Society of Instrument and Control Engineers (SICE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9905734\/9905735\/09905863.pdf?arnumber=9905863","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,11,28]],"date-time":"2022-11-28T15:24:55Z","timestamp":1669649095000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9905863\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9,6]]},"references-count":7,"URL":"https:\/\/doi.org\/10.23919\/sice56594.2022.9905863","relation":{},"subject":[],"published":{"date-parts":[[2022,9,6]]}}}