{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T18:49:12Z","timestamp":1725734952484},"reference-count":5,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,6]]},"DOI":"10.23919\/vlsic.2019.8778069","type":"proceedings-article","created":{"date-parts":[[2019,7,29]],"date-time":"2019-07-29T23:44:52Z","timestamp":1564443892000},"page":"C322-C323","source":"Crossref","is-referenced-by-count":3,"title":["A High Current efficiency Stacked Digital Low Dropout Array with True-Random-Noise Injection and Ultralow Output Ripple for Power-Side Channel Attack Protection"],"prefix":"10.23919","author":[{"given":"Cheng-Yen","family":"Lee","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tzu-Ping","family":"Huang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ke-Horng","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ying-Hsi","family":"Lin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shian-Ru","family":"Lin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tsung-Yen","family":"Tsai","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","first-page":"340","author":"salem","year":"2017","journal-title":"IEEE ISSCC Dig Tech Papers"},{"key":"ref3","first-page":"338","author":"tsou","year":"2017","journal-title":"IEEE ISSCC Dig Tech Papers"},{"key":"ref5","first-page":"3300","author":"das","year":"2018","journal-title":"IEEE"},{"key":"ref2","first-page":"342","author":"huang","year":"2017","journal-title":"IEEE ISSCC Dig Tech Papers"},{"key":"ref1","first-page":"310","author":"lu","year":"2018","journal-title":"IEEE ISSCC Dig Tech Papers"}],"event":{"name":"2019 Symposium on VLSI Circuits","start":{"date-parts":[[2019,6,9]]},"location":"Kyoto, Japan","end":{"date-parts":[[2019,6,14]]}},"container-title":["2019 Symposium on VLSI Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8766307\/8777931\/08778069.pdf?arnumber=8778069","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,22]],"date-time":"2019-08-22T17:20:35Z","timestamp":1566494435000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8778069\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6]]},"references-count":5,"URL":"https:\/\/doi.org\/10.23919\/vlsic.2019.8778069","relation":{},"subject":[],"published":{"date-parts":[[2019,6]]}}}