{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,31]],"date-time":"2024-08-31T06:32:16Z","timestamp":1725085936652},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,6,11]],"date-time":"2023-06-11T00:00:00Z","timestamp":1686441600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,6,11]],"date-time":"2023-06-11T00:00:00Z","timestamp":1686441600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,6,11]]},"DOI":"10.23919\/vlsitechnologyandcir57934.2023.10185219","type":"proceedings-article","created":{"date-parts":[[2023,7,24]],"date-time":"2023-07-24T17:36:33Z","timestamp":1690220193000},"source":"Crossref","is-referenced-by-count":2,"title":["A 187dB FoMS 46fJ\/Conv. 2<sup>nd<\/sup>-order Highpass \u0394\u2211 Capacitance-to-Digital Converter"],"prefix":"10.23919","author":[{"given":"Yoontae","family":"Jung","sequence":"first","affiliation":[{"name":"KAIST,Daejeon,Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sein","family":"Oh","sequence":"additional","affiliation":[{"name":"KAIST,Daejeon,Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jimin","family":"Koo","sequence":"additional","affiliation":[{"name":"KAIST,Daejeon,Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Seunga","family":"Park","sequence":"additional","affiliation":[{"name":"KAIST,Daejeon,Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ji-Hoon","family":"Suh","sequence":"additional","affiliation":[{"name":"KAIST,Daejeon,Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Donghee","family":"Cho","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwasung,Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sohmyung","family":"Ha","sequence":"additional","affiliation":[{"name":"New York University Abu Dhabi,Abu Dhabi,United Arab Emirates"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Minkyu","family":"Je","sequence":"additional","affiliation":[{"name":"KAIST,Daejeon,Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref7","year":"0","journal-title":"Sensor & MEMS"},{"key":"ref4","author":"tang","year":"2019","journal-title":"ISSCC"},{"key":"ref3","author":"li","year":"0","journal-title":"ISSCC"},{"key":"ref6","author":"baik","year":"2022","journal-title":"SOVC"},{"key":"ref5","author":"park","year":"2021","journal-title":"SOVC"},{"key":"ref2","author":"park","year":"2019","journal-title":"JSSC"},{"key":"ref1","author":"tan","year":"2016","journal-title":"JSSC"}],"event":{"name":"2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","location":"Kyoto, Japan","start":{"date-parts":[[2023,6,11]]},"end":{"date-parts":[[2023,6,16]]}},"container-title":["2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10185199\/10185158\/10185219.pdf?arnumber=10185219","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,28]],"date-time":"2023-08-28T17:40:19Z","timestamp":1693244419000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10185219\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,6,11]]},"references-count":7,"URL":"https:\/\/doi.org\/10.23919\/vlsitechnologyandcir57934.2023.10185219","relation":{},"subject":[],"published":{"date-parts":[[2023,6,11]]}}}