{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,16]],"date-time":"2026-07-16T15:55:19Z","timestamp":1784217319903,"version":"3.55.0"},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,6,11]],"date-time":"2023-06-11T00:00:00Z","timestamp":1686441600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,6,11]],"date-time":"2023-06-11T00:00:00Z","timestamp":1686441600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,6,11]]},"DOI":"10.23919\/vlsitechnologyandcir57934.2023.10185242","type":"proceedings-article","created":{"date-parts":[[2023,7,24]],"date-time":"2023-07-24T17:36:33Z","timestamp":1690220193000},"page":"1-2","source":"Crossref","is-referenced-by-count":2,"title":["A 0.22mm<sup>2<\/sup> per Channel Data Link for Reinforced Isolation with &gt;25kVpk Surge Tolerance and &gt;295kV\/\u03bcs Common Mode Transient Immunity"],"prefix":"10.23919","author":[{"given":"Dongwan","family":"Ha","sequence":"first","affiliation":[{"name":"Analog Devices, Inc.,Wilmington,MA,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ruida","family":"Yun","sequence":"additional","affiliation":[{"name":"Analog Devices, Inc.,Wilmington,MA,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kevin","family":"Wrenner","sequence":"additional","affiliation":[{"name":"Analog Devices, Inc.,Wilmington,MA,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","first-page":"16","volume-title":"IEEE Instrum. Meas. Mag.","author":"Kliger","year":"2003"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.4337\/9781840647723.00019"},{"key":"ref3","first-page":"9","volume-title":"ISSCC","author":"Xu","year":"2022"},{"key":"ref4","first-page":"434","volume-title":"ISSCC","author":"Mukherjee","year":"2017"},{"key":"ref5","first-page":"1","volume-title":"VLSI Circuits","author":"Yun","year":"2016"},{"key":"ref6","volume-title":"ISO774x datasheet, Rev. G","year":"2020"}],"event":{"name":"2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","location":"Kyoto, Japan","start":{"date-parts":[[2023,6,11]]},"end":{"date-parts":[[2023,6,16]]}},"container-title":["2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10185199\/10185158\/10185242.pdf?arnumber=10185242","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,13]],"date-time":"2024-03-13T18:53:55Z","timestamp":1710356035000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10185242\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,6,11]]},"references-count":6,"URL":"https:\/\/doi.org\/10.23919\/vlsitechnologyandcir57934.2023.10185242","relation":{},"subject":[],"published":{"date-parts":[[2023,6,11]]}}}