{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,7]],"date-time":"2026-07-07T23:49:39Z","timestamp":1783468179599,"version":"3.55.0"},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,6,11]],"date-time":"2023-06-11T00:00:00Z","timestamp":1686441600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,6,11]],"date-time":"2023-06-11T00:00:00Z","timestamp":1686441600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,6,11]]},"DOI":"10.23919\/vlsitechnologyandcir57934.2023.10185258","type":"proceedings-article","created":{"date-parts":[[2023,7,24]],"date-time":"2023-07-24T13:36:33Z","timestamp":1690205793000},"page":"1-2","source":"Crossref","is-referenced-by-count":14,"title":["Demonstration of crystalline IGZO transistor with high thermal stability for memory applications"],"prefix":"10.23919","author":[{"given":"Whayoung","family":"Kim","sequence":"first","affiliation":[{"name":"R&D Division, SK hynix Inc.,,Icheon,South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jaehyeon","family":"Kim","sequence":"additional","affiliation":[{"name":"R&D Division, SK hynix Inc.,,Icheon,South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Dongjin","family":"Ko","sequence":"additional","affiliation":[{"name":"R&D Division, SK hynix Inc.,,Icheon,South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jun-Hwe","family":"Cha","sequence":"additional","affiliation":[{"name":"R&D Division, SK hynix Inc.,,Icheon,South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Gyeongcheol","family":"Park","sequence":"additional","affiliation":[{"name":"R&D Division, SK hynix Inc.,,Icheon,South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Youngbae","family":"Ahn","sequence":"additional","affiliation":[{"name":"R&D Division, SK hynix Inc.,,Icheon,South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jong-Young","family":"Lee","sequence":"additional","affiliation":[{"name":"R&D Division, SK hynix Inc.,,Icheon,South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Minchul","family":"Sung","sequence":"additional","affiliation":[{"name":"R&D Division, SK hynix Inc.,,Icheon,South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hyejung","family":"Choi","sequence":"additional","affiliation":[{"name":"R&D Division, SK hynix Inc.,,Icheon,South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Seung Wook","family":"Ryu","sequence":"additional","affiliation":[{"name":"R&D Division, SK hynix Inc.,,Icheon,South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Seiyon","family":"Kim","sequence":"additional","affiliation":[{"name":"R&D Division, SK hynix Inc.,,Icheon,South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Myunghee","family":"Na","sequence":"additional","affiliation":[{"name":"R&D Division, SK hynix Inc.,,Icheon,South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Seonyong","family":"Cha","sequence":"additional","affiliation":[{"name":"R&D Division, SK hynix Inc.,,Icheon,South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref7","first-page":"1","author":"kang","year":"2015","journal-title":"AELM"},{"key":"ref4","volume":"8","author":"yeon","year":"2016","journal-title":"NPG"},{"key":"ref3","first-page":"1","author":"chakraborty","year":"2020","journal-title":"VLSI"},{"key":"ref6","first-page":"4037","volume":"3","year":"2021","journal-title":"MJ van Setten ACS"},{"key":"ref5","first-page":"203508","volume":"98","author":"lee","year":"2011","journal-title":"APL"},{"key":"ref2","author":"oota","year":"2019","journal-title":"IEDM"},{"key":"ref1","first-page":"44305","volume":"11","author":"kamiya","year":"2010","journal-title":"STAM"}],"event":{"name":"2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","location":"Kyoto, Japan","start":{"date-parts":[[2023,6,11]]},"end":{"date-parts":[[2023,6,16]]}},"container-title":["2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10185199\/10185158\/10185258.pdf?arnumber=10185258","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,7,24]],"date-time":"2023-07-24T17:43:53Z","timestamp":1690220633000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10185258\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,6,11]]},"references-count":7,"URL":"https:\/\/doi.org\/10.23919\/vlsitechnologyandcir57934.2023.10185258","relation":{},"subject":[],"published":{"date-parts":[[2023,6,11]]}}}