{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,2]],"date-time":"2026-06-02T09:09:03Z","timestamp":1780391343834,"version":"3.54.1"},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,6,11]],"date-time":"2023-06-11T00:00:00Z","timestamp":1686441600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,6,11]],"date-time":"2023-06-11T00:00:00Z","timestamp":1686441600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100020950","name":"National Science and Technology Council","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100020950","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,6,11]]},"DOI":"10.23919\/vlsitechnologyandcir57934.2023.10185274","type":"proceedings-article","created":{"date-parts":[[2023,7,24]],"date-time":"2023-07-24T13:36:33Z","timestamp":1690205793000},"page":"1-2","source":"Crossref","is-referenced-by-count":9,"title":["FeRAM Recovery up to 200 Periods with Accumulated Endurance 1012 Cycles and an Applicable Array Circuit toward Unlimited eNVM Operations"],"prefix":"10.23919","author":[{"given":"K.-Y.","family":"Hsiang","sequence":"first","affiliation":[{"name":"Institute and Undergraduate Program of Electro-Optical Engineering, National Taiwan Normal University,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"J.-Y.","family":"Lee","sequence":"additional","affiliation":[{"name":"Institute and Undergraduate Program of Electro-Optical Engineering, National Taiwan Normal University,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"F.-S.","family":"Chang","sequence":"additional","affiliation":[{"name":"Institute and Undergraduate Program of Electro-Optical Engineering, National Taiwan Normal University,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Z.-F.","family":"Lou","sequence":"additional","affiliation":[{"name":"Institute and Undergraduate Program of Electro-Optical Engineering, National Taiwan Normal University,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Z.-X.","family":"Li","sequence":"additional","affiliation":[{"name":"Institute and Undergraduate Program of Electro-Optical Engineering, National Taiwan Normal University,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Z.-H.","family":"Li","sequence":"additional","affiliation":[{"name":"Institute and Undergraduate Program of Electro-Optical Engineering, National Taiwan Normal University,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"J.-H.","family":"Chen","sequence":"additional","affiliation":[{"name":"Institute and Undergraduate Program of Electro-Optical Engineering, National Taiwan Normal University,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"C. W.","family":"Liu","sequence":"additional","affiliation":[{"name":"National Taiwan University,Graduate School of Advance Technology,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"T.-H.","family":"Hou","sequence":"additional","affiliation":[{"name":"Institute of Electronics, National Yang Ming Chiao Tung University,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"M. H.","family":"Lee","sequence":"additional","affiliation":[{"name":"Institute and Undergraduate Program of Electro-Optical Engineering, National Taiwan Normal University,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref4","first-page":"763","author":"hsiang","year":"2022","journal-title":"IEDM"},{"key":"ref3","first-page":"6t","article-title":"VLSI Symp","author":"liao","year":"2021"},{"key":"ref6","first-page":"3667","article-title":"Nano Res","volume":"15","author":"yuan","year":"2022"},{"key":"ref5","first-page":"2100151","article-title":"Adv. Electron. Mater","volume":"7","author":"takada","year":"2021"},{"key":"ref2","first-page":"1","volume":"3a","author":"chang","year":"2022","journal-title":"IRPS"},{"key":"ref1","first-page":"605","author":"chang","year":"2020","journal-title":"IEDM"}],"event":{"name":"2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","location":"Kyoto, Japan","start":{"date-parts":[[2023,6,11]]},"end":{"date-parts":[[2023,6,16]]}},"container-title":["2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10185199\/10185158\/10185274.pdf?arnumber=10185274","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,7,24]],"date-time":"2023-07-24T17:18:15Z","timestamp":1690219095000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10185274\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,6,11]]},"references-count":6,"URL":"https:\/\/doi.org\/10.23919\/vlsitechnologyandcir57934.2023.10185274","relation":{},"subject":[],"published":{"date-parts":[[2023,6,11]]}}}