{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,25]],"date-time":"2026-04-25T18:49:40Z","timestamp":1777142980250,"version":"3.51.4"},"reference-count":16,"publisher":"Polish Academy of Sciences Chancellery","issue":"2","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,1,1]]},"abstract":"<jats:title>Comparative Analysis of Three Algorithms for Two-Channel Common Frequency Sinewave Parameter Estimation: Ellipse Fit, Seven Parameter Sine Fit and Spectral Sinc Fit<\/jats:title><jats:p>In this paper, a comparison analysis of three different algorithms for the estimation of sine signal parameters in two-channel common frequency situations is presented. The relevance of this situation is clearly understood in multiple applications where the algorithms have been applied. They include impedance measurements, eddy currents testing, laser anemometry and radio receiver testing for example. The three algorithms belong to different categories because they are based on different approaches. The ellipse fit algorithm is a parametric fit based on the XY plot of the samples of both signals. The seven parameter sine fit algorithm is a least-squares algorithm based on the time domain fitting of a single tone sinewave model to the acquired samples. The spectral sinc fit performs a fitting in the frequency domain of the exact model of an acquired sinewave on the acquired spectrum. Multiple simulation situations and real measurements are included in the comparison to demonstrate the weaknesses and strong points of each algorithm.<\/jats:p>","DOI":"10.2478\/v10178-010-0022-8","type":"journal-article","created":{"date-parts":[[2010,11,11]],"date-time":"2010-11-11T05:04:48Z","timestamp":1289451888000},"page":"255-270","source":"Crossref","is-referenced-by-count":12,"title":["Comparative Analysis of Three Algorithms for Two-Channel Common Frequency Sinewave Parameter Estimation: Ellipse Fit, Seven Parameter Sine Fit and Spectral Sinc Fit"],"prefix":"10.24425","volume":"17","author":[{"given":"Pedro","family":"Ramos","sequence":"first","affiliation":[]},{"given":"Fernando","family":"Janeiro","sequence":"additional","affiliation":[]},{"given":"Tom\u00e1\u0161","family":"Radil","sequence":"additional","affiliation":[]}],"member":"37468","reference":[{"key":"1","unstructured":"<i>IEEE Standard for Digitizing Waveform Records<\/i>. (2007). 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