{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,14]],"date-time":"2025-10-14T06:57:34Z","timestamp":1760425054323},"reference-count":9,"publisher":"Polish Academy of Sciences Chancellery","issue":"2","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,1,1]]},"abstract":"<jats:title>DSPIC-Based Impedance Measuring Instrument<\/jats:title>\n        <jats:p>An implemented impedance measuring instrument is described in this paper. The device uses a dsPIC (Digital Signal Peripheral Interface Controller) as a processing unit, and a DDS (Direct Digital Synthesizer) to stimulate the measurement circuit composed by the reference impedance and the unknown impedance. The voltages across the impedances are amplified by programmable gain instrumentation amplifiers and then digitized by analog to digital converters. The impedance is measured by applying a seven-parameter sine-fitting algorithm to estimate the sine signal parameters. The dsPIC communicates through RS-232 or USB with a computer, where the measurement results can be analyzed. The device also has an LCD to display the measurement results.<\/jats:p>","DOI":"10.2478\/v10178-011-0002-0","type":"journal-article","created":{"date-parts":[[2011,6,10]],"date-time":"2011-06-10T08:40:51Z","timestamp":1307695251000},"page":"185-198","source":"Crossref","is-referenced-by-count":14,"title":["DSPIC-Based Impedance Measuring Instrument"],"prefix":"10.24425","volume":"18","author":[{"given":"Jos\u00e9","family":"Santos","sequence":"first","affiliation":[]},{"given":"Pedro","family":"Ramos","sequence":"additional","affiliation":[]}],"member":"37468","reference":[{"issue":"1","key":"1","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1023\/B:IJOT.0000022325.10161.39","article-title":"Viscosity measurements of liquid toluene at low temperatures using a dual vibrating-wire technique","volume":"25","author":"F. Caetano","year":"2004","journal-title":"Int. J. Thermophys"},{"key":"2","unstructured":"Agilent 4294A Precision Impedance Analyzer. (2008). Datasheet for Agilent Technologies. <a target=\"_blank\" href='http:\/\/www.agilent.com'>http:\/\/www.agilent.com<\/a>"},{"key":"3","unstructured":"IEEE Std. 1057-1994. (December 1994). <i>Standard for Digitizing Waveform Records.<\/i> The Institute of Electrical and Electronics Engineers. New York."},{"issue":"2","key":"4","doi-asserted-by":"crossref","first-page":"135","DOI":"10.1016\/j.measurement.2006.03.011","article-title":"A new sine-fitting algorithm for accurate amplitude and phase measurements in two channel acquisition systems","volume":"41","author":"P. Ramos","year":"2008","journal-title":"Measurement, Elsevier"},{"issue":"5","key":"5","doi-asserted-by":"crossref","first-page":"1680","DOI":"10.1109\/TIM.2009.2014512","article-title":"Recent Developments on Impedance Measurements With DSP-Based Ellipse-Fitting Algorithms","volume":"58","author":"P. Ramos","year":"2009","journal-title":"IEEE Trans. Instrum. Meas"},{"key":"6","unstructured":"<i>The Impedance Measurement Handbook - A Guide to Measurement Technologies and Techniques.<\/i> (2000). Agilent Technologies Co."},{"key":"7","unstructured":"3532-50 LCR HiTESTER. (2005). Datasheet for HIOKI. <a target=\"_blank\" href='http:\/\/www.hioki.com'>http:\/\/www.hioki.com<\/a>"},{"key":"8","doi-asserted-by":"crossref","first-page":"287","DOI":"10.1109\/TIM.1984.4315226","article-title":"High-accuracy spectrum analysis of sampled discrete frequency signals by analytical leakage compensation","volume":"33","author":"H. Renders","year":"1984","journal-title":"IEEE Trans. Instrum. Meas"},{"issue":"8","key":"9","doi-asserted-by":"crossref","first-page":"1661","DOI":"10.1109\/TIM.2008.923782","article-title":"Parameter estimation employing a dual-channel sine-wave model under a gaussian assumption","volume":"57","author":"P. H\u00e4ndel","year":"2008","journal-title":"IEEE Trans. Instrum. Meas"}],"container-title":["Metrology and Measurement Systems"],"original-title":[],"link":[{"URL":"http:\/\/content.sciendo.com\/view\/journals\/mms\/18\/2\/article-p185.xml","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/www.degruyter.com\/view\/j\/mms.2011.xviii.issue-2\/v10178-011-0002-0\/v10178-011-0002-0.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,3,22]],"date-time":"2023-03-22T14:01:12Z","timestamp":1679493672000},"score":1,"resource":{"primary":{"URL":"http:\/\/journals.pan.pl\/dlibra\/publication\/103756\/edition\/89762\/content"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,1,1]]},"references-count":9,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.2478\/v10178-011-0002-0","relation":{},"ISSN":["0860-8229"],"issn-type":[{"value":"0860-8229","type":"print"}],"subject":[],"published":{"date-parts":[[2011,1,1]]}}}