{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,5]],"date-time":"2022-04-05T07:33:41Z","timestamp":1649144021141},"reference-count":0,"publisher":"Lavoisier","issue":"7","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["TSI"],"published-print":{"date-parts":[[2004,7,1]]},"DOI":"10.3166\/tsi.23.905-928","type":"journal-article","created":{"date-parts":[[2008,8,27]],"date-time":"2008-08-27T05:16:03Z","timestamp":1219814163000},"page":"905-928","source":"Crossref","is-referenced-by-count":0,"title":["Strat\u00e9gie de couverture de test \u00e0 un haut niveau d'abstraction"],"prefix":"10.3166","volume":"23","author":[{"given":"Pierre","family":"Bontron","sequence":"first","affiliation":[]},{"given":"Marie-Laure","family":"Potet","sequence":"additional","affiliation":[]}],"member":"1762","container-title":["Techniques et sciences informatiques"],"original-title":[],"deposited":{"date-parts":[[2008,8,27]],"date-time":"2008-08-27T05:12:37Z","timestamp":1219813957000},"score":1,"resource":{"primary":{"URL":"http:\/\/tsi.revuesonline.com\/article.jsp?articleId=5401"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2004,7,1]]},"references-count":0,"journal-issue":{"issue":"7","published-print":{"date-parts":[[2004,7,1]]}},"URL":"https:\/\/doi.org\/10.3166\/tsi.23.905-928","relation":{},"ISSN":["0752-4072"],"issn-type":[{"value":"0752-4072","type":"print"}],"subject":[],"published":{"date-parts":[[2004,7,1]]}}}