{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,20]],"date-time":"2025-03-20T04:11:07Z","timestamp":1742443867762,"version":"3.40.1"},"reference-count":0,"publisher":"IOS Press","isbn-type":[{"value":"9781643685724","type":"electronic"}],"license":[{"start":{"date-parts":[[2025,3,17]],"date-time":"2025-03-17T00:00:00Z","timestamp":1742169600000},"content-version":"unspecified","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,3,17]]},"abstract":"<jats:p>The early and automatic detection of faulty behavior is essential for maintaining the reliability of a cyber-physical system. In this paper we describe a fault localization approach for such a highly complex distributed system, the optical synchronization system of the European X-ray free-electron laser. Using a dependency graph, we model the relationships between the components and the influences of environmental effects. After we first resolve linear long-term dependencies between dependent components with a correlation analysis, we then use an unsupervised fault detection pipeline consisting of statistical feature extraction and unsupervised anomaly detection to accurately identify anomalies and localize their origins in the system.<\/jats:p>","DOI":"10.3233\/faia241577","type":"book-chapter","created":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T08:29:08Z","timestamp":1742372948000},"source":"Crossref","is-referenced-by-count":0,"title":["Data-Driven Fault Localization in Cyber-Physical Systems Using Dependency Graphs and Anomaly Detection"],"prefix":"10.3233","author":[{"given":"Arne","family":"Gr\u00fcnhagen","sequence":"first","affiliation":[{"name":"Hamburg University of Applied Sciences, HAW, Germany"},{"name":"Hamburg University of Technology, TUHH, Germany"},{"name":"Deutsches Elektronen-Synchrotron DESY, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Annika","family":"Eichler","sequence":"additional","affiliation":[{"name":"Hamburg University of Technology, TUHH, Germany"},{"name":"Deutsches Elektronen-Synchrotron DESY, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marina","family":"Tropmann-Frick","sequence":"additional","affiliation":[{"name":"Hamburg University of Applied Sciences, HAW, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G\u00f6rschwin","family":"Fey","sequence":"additional","affiliation":[{"name":"Hamburg University of Technology, TUHH, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"7437","container-title":["Frontiers in Artificial Intelligence and Applications","Information Modelling and Knowledge Bases XXXVI"],"original-title":[],"link":[{"URL":"https:\/\/ebooks.iospress.nl\/pdf\/doi\/10.3233\/FAIA241577","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T08:29:09Z","timestamp":1742372949000},"score":1,"resource":{"primary":{"URL":"https:\/\/ebooks.iospress.nl\/doi\/10.3233\/FAIA241577"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3,17]]},"ISBN":["9781643685724"],"references-count":0,"URL":"https:\/\/doi.org\/10.3233\/faia241577","relation":{},"ISSN":["0922-6389","1879-8314"],"issn-type":[{"value":"0922-6389","type":"print"},{"value":"1879-8314","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,3,17]]}}}